Publicaciones
Affichage de 12681 à 12690 sur 16261
Convertisseur numérique analogique 1 bit à 7,8Gech/s pour émetteurs RF numériques en technologie CMOS 90nm
A. Flament, A. Frappé, B. Stefanelli, A. Kaiser, A. Cathelin
2006, pp.115-118. ⟨hal-00138681⟩
40 nm PtSi-based Schottky-barrier p-MOSFETs with a midgap tungsten gate
Emmanuel Dubois, G. Larrieu
7th Symposium Diagnostics & Yield Advanced Silicon Devices and Technologies for ULSI Era, 2006, Warsaw, Poland. ⟨hal-00138697⟩
Laser Doppler vibrometry for evaluating the piezoeletric coefficient d33 of thin film
R. Herdier, D. Jenkins, El Hadj Dogheche, Denis Remiens, M. Sulc
Review of Scientific Instruments, 2006, 77, pp.093905-1-5. ⟨hal-00138709⟩
Fundamentals and theory
B. Demoulin
Ben Dhia S., Ramdani M., Sicard E. Electromagnetic compatibility of integrated circuits - Techniques for low emission and susceptibility, Springer US, pp.55-61, 2006. ⟨hal-00140359⟩
Digital microfluidics using EWOD and SAW actuation for biological applications
C. Druon
3rd Microfluidics French Conference, µFlu'06, 2006, Toulouse, France. ⟨hal-00140172⟩
Cross-talk coupling, a tool to characterize electromagnetic immunity of integrated circuits
S. Bazzoli, N. Ben Slimen, L. Kone, B. Demoulin
2006, pp.223-240. ⟨hal-00140183⟩
Multiexponential photoluminescence decay in indirect-gap semiconductor nanocrystals
Christophe Delerue, Guy Allan, Cécile Reynaud, Olivier Guillois, Gilles Ledoux, Friedrich Huisken
Physical Review B: Condensed Matter and Materials Physics (1998-2015), 2006, 73, pp.235318 1-4. ⟨10.1103/PhysRevB.73.235318⟩. ⟨hal-00092072⟩
The effects of self-assembled monolayers gate dielectrics treatment on pentacene thin film transistor characteristics
K. Lmimouni, R. Bianchini, S. Lenfant, David Troadec, D. Vuillaume
Indo-French workshop on molecular and organic devices, 2006, Lille, France. ⟨hal-00127157⟩
Molecular scale electronics in France
S. Lenfant, D. Vuillaume
Indo-French Chamber Commerce and Industry (IFCCI) and the Indo-French Technical Association (IFTA), 2006, Mumbai, India. ⟨hal-00127159⟩
Power measurement setup for large signal microwave characterization at 94 GHz
F Medjdoub, S. Vandenbrouck, Christophe Gaquière, E. Delos, M. Zaknoune, D. Theron
IEEE Electron Device Letters, 2006, 16, pp.218-220. ⟨hal-00127945⟩