Publicaciones
Affichage de 13881 à 13890 sur 16256
Design space exploration for analog IPs using Cairo+
R. Iskander, L. de Lamarre, A. Kaiser, M.M. Louerat
2004, pp.473 - 476. ⟨hal-00140990⟩
Simulation et optimisation d'une mémoire flash nanométrique
Christophe Krzeminski, Emmanuel Dubois, Xing Tang, N. Reckinger, A. Crahay, V. Bayot
Journées Nationales Nanoélectronique, 2004, Aussois, France. ⟨hal-00140993⟩
Ideal subthreshold characteristics of thin-film SOI p-MOSFETs with Schottky source/drain and a midgap tungsten gate
G. Larrieu, Emmanuel Dubois
IEE Proceedings Microwaves Antennas and Propagation, 2004, 25, pp.801-803. ⟨hal-00140978⟩
Intégration de source/drain Schottky en technologie MOS décananométrique
Emmanuel Dubois, G. Larrieu
Journée Club EEA : Electronique des Dispositifs Ultimes et Innovants, 2004, Fuveau, France. ⟨hal-00141009⟩
Silicon-molecules-metal junctions by nanotransfer printing
C. Merckling, David Guérin, S. Lenfant, D. Vuillaume
European Conference on Organized Films, ECOF 2004, 2004, Valladolid, Spain. ⟨hal-00140759⟩
On the modelling of transient diffusion and activation of boron during post-implantation annealing
P. Pichler, C.J. Ortiz, B. Colombeau, N.E.B. Cowern, E. Lampin, Alain Claverie, Fuccio Cristiano, W. Lerch, S. Paul
International Electron Devices Meeting, IEDM 2004, 2004, San Francisco, CA, United States. ⟨hal-00141013⟩
Design of planar filter for millimeter wave applications up to 220 GHz
Gaëtan Prigent, Eric Rius, Henri Happy, Karine Blary
Proceedings of the 2004 International Workshop on Microwave Filters, 2004, Toulouse, France. ⟨hal-00142277⟩
Electromagnetic susceptibility of IC's due to HPM coupling
S. Bazzoli, B. Demoulin, P. Hoffmann, M. Cauterman
2004, pp.95. ⟨hal-00142335⟩
Using low frequency noise characterization of AlGaN/GaN HEMT as a tool for technology assessment and failure prediction
Jean-Guy Tartarin, Geoffroy Soubercaze-Pun, Abdelali Rennane, Laurent Bary, Jean-Claude de Jaeger, Marie Germain, S. Delage, Robert Plana, Jacques Graffeuil
Using low frequency noise characterization of AlGaN/GaN HEMT as a tool for technology assessment and failure prediction . 2004, pp.296-306. ⟨hal-00141968⟩