Publicaciones
Affichage de 13931 à 13940 sur 16256
Reconstruction of bubble translation in travelling ultrasonic waves
P. Koch, R. Mettin, T. Tervo, W. Lauterborn, Bertrand Dubus, A. Moussatov
9th Meeting of the European Society of Sonochemistry, 2004, Badajoz, Spain. ⟨hal-00133873⟩
One-dimensional reconstruction of a defect profile based on millimeter-wave nondestructive techniques
M. Maazi, D. Glay, T. Lasri
Microwave and Optical Technology Letters, 2004, 43, pp.133-138. ⟨hal-00133929⟩
Technologie pour dispositifs AlInAs/GaInAs
J.S. Galloo, E. Pichonat, S. Bollaert, Yannick Roelens, X. Wallart, A. Cappy
GDR Nanoélectronique, 2004, Aussois, France. ⟨hal-00133917⟩
Stage de sensibilisation au travail en salle blanche et caractérisation d'une pince en polymère actionnée par un alliage à mémoire de forme en film mince
I. Roch, S. Masson, P. Delemotte, Philippe Pernod, H. Happy
8èmes Journées Pédagogiques du CNFM, 2004, Saint-Malo, France. ⟨hal-00133918⟩
Nonlinear effects in T-branch junctions
J. Mateos, B.G. Vasallo, D. Pardo, T. Gonzales, E. Pichonat, J.S. Galloo, S. Bollaert, Yannick Roelens, A. Cappy
IEEE Electron Device Letters, 2004, 25, pp.235-237. ⟨hal-00133878⟩
2D numerical simulation of supercritical phase conjugation of ultrasound in active solid
Olivier Bou Matar, Vladimir Preobrazhensky, Philippe Pernod
2004, pp.1627-1630. ⟨hal-00162781⟩
Principles of ultrasonic velocimetry by means of nonlinear interaction of phase conjugate waves
Y. Pyl'Nov, Vladimir Preobrazhensky
2004, pp.1612-1615. ⟨hal-00162782⟩
Cavitation bubble structures in low and high intensity ultrasonic fields
A. Moussatov, C. Granger, Bertrand Dubus, R. Mettin, T. Tervo, W. Lauterborn
Anglo-French Physical Acoustics Conference, 2004, Wye, United Kingdom. ⟨hal-00133856⟩
Conductivity of DNA probed by conducting-atomic force microscopy : effects of contact electrode, DNA stucture and surface interactions
T. Heim, D. Deresmes, Dominique Vuillaume
Journal of Applied Physics, 2004, 96, pp.2927-2936. ⟨10.1063/1.1769606⟩. ⟨hal-00140730⟩
Aluminum, oxide and silicon phonons by IETS on MOS tunnel junctions : accurate determination and effect of electrical stress
C. Petit, G. Salace, D. Vuillaume
Journal of Applied Physics, 2004, 96, pp.5042-5049. ⟨hal-00140733⟩