Publicaciones

• Article dans une revue

Estimation of internal stress profiles using the Barkhausen noise effect. Application : verification to the homogeneity of the shot peening process performed on the raceways of aerospace bearing rings

S. Desvaux, Marc Duquennoy, Mohammadi Ouaftouh, J. Gualandri, Mohamed Ourak

Transactions of the ASME, Journal of Applied Mechanics, 2006, 73, pp.342-346. ⟨hal-00140200⟩

• Article dans une revue

Performance indicator for DMT systems with non perfect channel estimation

David Buèche, Patrick Corlay, Marc G. Gazalet, François-Xavier Coudoux, Marc Slachciak

In this letter, we analyse the bit error rate (BER) of a discrete multitone modulation system considering the channel estimation error for the frequency equalisation. After having established an approximate relation for the BER, we propose a simple performance indicator, which accounts for the...

European Transactions on Telecommunications, 2006, 17 (5), pp.591-597. ⟨10.1002/ett.1113⟩. ⟨hal-00128172⟩

• Article dans une revue

Strain determination in MBE-grown InAs quantum wires on InP

A. Mazuelas, L. Gonzalez, J. M. Garcia, Y. Gonzalez, T. Schuelli, C. Priester, H. T. Metzger

Physical Review B: Condensed Matter and Materials Physics (1998-2015), 2006, 73, pp.045312-1-6. ⟨hal-00127060⟩

• Communication dans un congrès

Transistors organiques utilisant une monocouche auto-assemblée comme élément actif

M. Mottaghi, P. Lang, F. Rodriguez, A. Yassar, G. Horowitz, S. Lenfant, D. Tondelier, D. Vuillaume

Dispositfs Electroniques Organiques, DIELOR 06, 2006, Paris, France. ⟨hal-00127139⟩

• Communication dans un congrès

Etude par microscopie à champ proche de structures à base de matériaux III-N pour émetteurs électroniques planaires

Sophie Barbet, Raphaël Aubry, Marie-Antoinette Di Forte-Poisson, Thierry Melin, Didier Theron

10èmes Journées de la Matière Condensée, Aug 2006, Toulouse, France. ⟨hal-00127893⟩

• Article dans une revue

Electronic properties of organic monolayers and molecular devices

D. Vuillaume, S. Lenfant, David Guérin, C. Delerue, C. Petit, G. Salace

Pramana - Journal of Physics, 2006, 67, pp.17-32. ⟨hal-00127117⟩

• Article dans une revue

Point-defect recombination efficiency at grain boundaries in irradiated SiC

A. Moriani, F. Cleri

Physical Review B: Condensed Matter and Materials Physics (1998-2015), 2006, 73, pp.214113-1-9. ⟨hal-00127847⟩

• Article dans une revue

Multiexponential photoluminescence decay in indirect-gap semiconductor nanocrystals

Christophe Delerue, Guy Allan, Cécile Reynaud, Olivier Guillois, Gilles Ledoux, Friedrich Huisken

The origin of the multiexponential photoluminescence (PL) decay of Si quantum dots (QDs) has been debated for a long time. We present studies combining time-resolved PL experiments and tight binding calculations of phonon-assisted optical transitions showing that the distribution of lifetimes and...

Physical Review B: Condensed Matter and Materials Physics (1998-2015), 2006, 73, pp.235318-1-4. ⟨10.1103/PhysRevB.73.235318⟩. ⟨hal-00127844⟩

• Article dans une revue

Electric force microscopy of individually charged semiconductor nanoparticles

Heinrich Diesinger, Thierry Melin, Sophie Barbet, D. Deresmes, Didier Stiévenard

Charge injection experiments by electrostatic force microscopy are performed on single semiconductor nanoparticles. Different methods of detecting the stored charge are used. Although the amount of charge stored in particles of realistic shape can be determined quantitatively, we present here a...

Physica Status Solidi A (applications and materials science), 2006, 203, pp.1344-1347. ⟨10.1002/pssa.200566162⟩. ⟨hal-00127830⟩

• Article dans une revue

Traps centers and deep defects contribution in current instabilities for AlGaN/GaN HEMT's on silicon and sapphire substrates

N. Sghaier, M. Trabelsi, N. Yacoubi, J.M. Bluet, A. Souifi, G. Guillot, Christophe Gaquière, Jean-Claude de Jaeger

Microelectronics Journal, 2006, 37, pp.363-370. ⟨hal-00127942⟩