Publicaciones

• Chapitre d'ouvrage

Theory of Si nanocrystals

Guy Allan, Christophe Delerue, Michel Lannoo

The intense luminescence observed for porous silicon [1] has raised extremely interesting problems related to the possibility of using silicon in optoelectronics. One likely explanation is quantum confinement, induced by the formation of nanocrystallites. However, the experimental data reveal a...

PAVESI L., GAPONENKO S., and DAL NEGRO L. Towards the first silicon laser, Kluwer Academic Publishers, pp.243-260, 2003, 978-1-4020-1194-8. ⟨10.1007/978-94-010-0149-6_22⟩. ⟨hal-00131749⟩

• Communication dans un congrès

Evolution de caractéristiques statiques de HEMTs AlGaN/GaN soumis à un stress électrique réalisé à différentes températures

B. Boudart, Jean-François Llibre, D. Briand, Boubekeur Tala-Ighil, H. Toutah, Yannick Guhel, Jean-Claude de Jaeger, Z. Bougrioua, Marianne Germain, Ingrid Moerman

13es Journées Nationales Microondes, 2003, Lille, France. ⟨hal-01654259⟩

• Chapitre d'ouvrage

Guided wave techniques for optical characterization of lead based ferroelectrics

El Hadj Dogheche, X. Lansiaux, Denis Remiens

REMIENS D. Recent research developments in piezoelectric materials for macro/micro systems, Research Signpost, Kerala, India, pp.211-235, 2003. ⟨hal-00132004⟩

• Communication dans un congrès

Conception de dispositifs passifs planaires en bande W

G. Prigent, E. Rius, François Le Pennec, S. Le Maguer, Cédric Quendo, G. Six, H. Happy, Gilles Dambrine

GDR Ondes, 2003, Marseille, France. ⟨hal-00250174⟩

• Communication dans un congrès

Transmission electron microscopy analysis of silicides used in ALSB-SOI MOSFET structures

J. Katcki, J. Ratajczak, A. Laszcz, F. Phillipp, Emmanuel Dubois, Guilhem Larrieu, Julien Penaud, Xavier Baie

In Accumulated Low Schottky Barrier metal oxide semiconductor field effect transistors (MOSFET) on SOl structures, very thin silicide layers are used for ohmic contacts. Silicide contacts form due to metallurgical reaction of metal with semiconductor. In order to get a broad vision of the most...

Conference on Microscopy of Semiconducting Materials, Mar 2003, Cambridge, United Kingdom. pp.479-482, ⟨10.1201/9781351074636-110⟩. ⟨hal-00250182⟩

• Communication dans un congrès

Evaluation de la dégradation de béton par ondes ultrasonores haute fréquence

Bogdan Piwakowski, M. Goueygou, S. Ould-Naffa, F. Buyle-Bodin

GDR Ondes, Contrôle non destructif, 2003, Paris, France. ⟨hal-00250186⟩

• Communication dans un congrès

High frequency noise sources extraction in nanometrique MOSFETs

Francois Danneville, G. Pailloncy, Gilles Dambrine

NATO Advanced Research Workshop, Advanced Experimental Methods for Noise Research in Nanoscale Electronic Devices, 2003, Brno, Czech Republic. ⟨hal-00146038⟩

• Communication dans un congrès

Nondestructive defects detection inside dielectric materials by microwave techniques

M. Maazi, D. Glay, T. Lasri

2003, pp.Session 3A. ⟨hal-00146044⟩

• Communication dans un congrès

Métamatériaux : évolution ou révolution

D. Lippens

Optique Hertzienne et Diélectrique, OHD 2003, 2003, Calais, France. ⟨hal-00146091⟩

• Communication dans un congrès

Nonlinear acoustics of phase conjugate waves in heterogeneous media (NGA approach)

Vladimir Preobrazhensky, Philippe Pernod

2003, pp.875-878. ⟨hal-00146134⟩