Publicaciones

Affichage de 3611 à 3620 sur 16278


  • Communication dans un congrès

Evidencing the Influence of Defects on the Charge Storage Mechanism of Sputtered Vanadium Nitride Pseudocapacitive Electrode

Thierry Brousse, Etienne Le Calvez, Kevin Robert, Marielle Huvé, Maya Marinova, Pascal Roussel, Laurent Fugère, Dmitri Yarekha, Olivier Crosnier, Camille Douard, Christophe Lethien

PRiME 2020 (Pacific Rim Meeting, ECS, ECSJ, KECS Joint Meeting), Oct 2020, Visioconférence, Japan. ⟨hal-04303350⟩

  • Communication dans un congrès

Pairing cells with different dimensions in a microfluidic device using a unidirectional flow

A. Shaik Faruk, Clara Lewuillon, Yasmine Touil, Aurélie Guillemette, Bruno Quesnel, Carine Brinster, Loic Lemonnier, Dominique Collard, Mehmet Tarhan

24th International Conference on Miniaturized Systems for Chemistry and Life Sciences, MicroTAS 2020, Oct 2020, Online, United States. pp.765-766. ⟨hal-03467637⟩

  • Poster de conférence

Dynamic characterization of micro/nanostructures wetting using high frequency acoustic waves

Abbas Salhab

Small-scale elastic metrology using high-frequency acoustic waves, Oct 2020, Online workshop only, France. ⟨hal-03591130⟩

  • Communication dans un congrès

Analysis of trap states in AlGaN/GaN self-switching diodes via impedance measurements

E. Perez-Martin, D. Vaquero, H. Sanchez-Martin, Christophe Gaquière, V. J. Raposo, T. Gonzalez, J. Mateos, I. Iniguez-De-La-Torre

The presence of trap states in self-switching diodes (SSD) based on an AlGaN/GaN heterojunction has been identified by means of their AC characterization between 75 kHz to 30 MHz in a wide temperature range, from 80 K to 300 K. Measurements allow us to determine two different characteristic...

31st European Symposium on Reliability of Electron Devices, Failure Physics and Analysis, ESREF 2020, Oct 2020, Athens, Greece. Microelectron. Reliab. 114, Special issue, 113806, ⟨10.1016/j.microrel.2020.113806⟩. ⟨hal-03321561⟩