Publicaciones

Affichage de 14751 à 14760 sur 16545


  • Communication dans un congrès

Transmission electron microscopy analysis of silicides used in ALSB-SOI MOSFET structures

J. Katcki, J. Ratajczak, A. Laszcz, F. Phillipp, Emmanuel Dubois, Guilhem Larrieu, Julien Penaud, Xavier Baie

In Accumulated Low Schottky Barrier metal oxide semiconductor field effect transistors (MOSFET) on SOl structures, very thin silicide layers are used for ohmic contacts. Silicide contacts form due to metallurgical reaction of metal with semiconductor. In order to get a broad vision of the most...

Conference on Microscopy of Semiconducting Materials, Mar 2003, Cambridge, United Kingdom. pp.479-482, ⟨10.1201/9781351074636-110⟩. ⟨hal-00250182⟩

  • Communication dans un congrès

Accordabilité d'un circuit microonde par adjonction d'un substrat cristal liquide

Nicolas Tentillier, Bertrand Splingart, Erick Paleczny, Jean-François Legier, Christian Legrand

Treizièmes Journées Nationales Micro-ondes (JNM 2003), May 2003, Lille, France. pp.3D-4. ⟨hal-00146562⟩

  • Article dans une revue

Actionneurs films minces pour contrôle santé de structures

E. Fribourg-Blanc, M. Dupont, D. Osmont, Eric Cattan, Denis Remiens

Instrumentation, Mesure, Métrologie, 2003, 3, pp.225-237. ⟨hal-00146476⟩

  • Communication dans un congrès

Comparative measurements of the optical spectrum dependence on distance between laterally coupled diode lasers

H. Lamela, R. Santos, G. Carpintero, Jean-Pierre Vilcot, A. Barsella, J. Figueiredo, M. Pessa

2003, pp.86-91. ⟨hal-00146495⟩

  • Communication dans un congrès

Novel dual-mode laser structures

S. Garidel, Jean-Pierre Vilcot, Didier Decoster, M. Francois, M. Muller

Semiconductor and Integrated Optoelectronics, SIOE 2003, 2003, Cardiff, Wales, United Kingdom. ⟨hal-00146584⟩

  • Article dans une revue

Optical properties of hexagonal boron nitride thin layers

A. Soltani, H. Bakhtiar, P. Thévenin, A. Bath

Jurnal Fizik UTM, 2003, 9, pp.17-25. ⟨hal-00146670⟩

  • Communication dans un congrès

High frequency noise sources extraction in nanometrique MOSFETs

Francois Danneville, G. Pailloncy, Gilles Dambrine

NATO Advanced Research Workshop, Advanced Experimental Methods for Noise Research in Nanoscale Electronic Devices, 2003, Brno, Czech Republic. ⟨hal-00146038⟩

  • Communication dans un congrès

Nondestructive defects detection inside dielectric materials by microwave techniques

M. Maazi, D. Glay, T. Lasri

2003, pp.Session 3A. ⟨hal-00146044⟩

  • Communication dans un congrès

Time frequency and Kalman filter based baud rate estimator

David Boulinguez, Christelle Garnier, Yves Delignon, Laurent Clavier

With the rising number of modulation types used in multiuser communication systems, we need to find efficient methods to discriminate them. Indeed, modulation recognition has become important in wireless communications for both civilian and military applications. Traditionally, to classify...

3rd International Symposium on Image and Signal Processing and Analysis, ISPA 2003, Sep 2003, Rome, Italy. pp.866-870, ⟨10.1109/ISPA.2003.1296400⟩. ⟨hal-00146072⟩