Publicaciones

Affichage de 8721 à 8730 sur 16549


  • Article dans une revue

Locating an individual quantum hall island inside a quantum ring

F. Martins, S. Faniel, M.G. Pala, Hermann Sellier, Serge Huant, L. Desplanque, X. Wallart, V. Bayot, B. Hackens

AIP Conference Proceedings, 2012, ISBN 978-0-7354-1194-4, 1566, pp.299-300. ⟨10.1063/1.4848404⟩. ⟨hal-00797345⟩

  • Article dans une revue

[Review] Characterization and analysis of electrical trap related effects on the reliability of AlGaN/GaN HEMTs

F. Berthet, Y. Guhel, H. Gualous, B. Boudart, J.L. Trolet, M. Piccione, V. Sbrugnera, B. Grimbert, Christophe Gaquière

Solid-State Electronics, 2012, 72, pp.15-21. ⟨10.1016/j.sse.2011.12.002⟩. ⟨hal-00788193⟩

  • Communication dans un congrès

A 60 GHz transceiver for low power ad hoc networks

Christophe Loyez, N. Rolland, Michael Bocquet

IEEE International Conference on Green Computing and Communications, GreenCom 2012, Workshop on Energy and Wireless Sensors, e-WiSe 2012, 2012, Besançon, France. pp.session 2 : Power Management, 671-674, ⟨10.1109/GreenCom.2012.108⟩. ⟨hal-00811708⟩

  • Communication dans un congrès

A 10GBits/s 2.1pJ/bit OOK demodulator at 60GHz for wireless chip-to-chip communication

S. Foulon, S. Pruvost, Christophe Loyez, N. Rolland, Vanessa Avramovic

IEEE Radio and Wireless Symposium, RWS 2012, 2012, Santa Clara, CA, United States. pp.291-294, ⟨10.1109/RWS.2012.6175320⟩. ⟨hal-00801068⟩

  • Article dans une revue

Supercritical dynamics of magnetoelastic wave triad in a solid

Vladimir Preobrazhensky, O. Yevstafyev, Philippe Pernod, Olivier Bou Matar, V. Berzhansky

Physics of Wave Phenomena, 2012, 20, pp.256-263. ⟨10.3103/S1541308X12040036⟩. ⟨hal-00787360⟩

  • Article dans une revue

Polymer-based zero-level packaging technology for high frequency RF applications by wafer bonding/debonding technique using an anti-adhesion layer

J.G. Kim, S. Seok, N. Rolland, P.A. Rolland

International Journal of Precision Engineering and Manufacturing, 2012, 13, pp.1861-1867. ⟨10.1007/s12541-012-0244-7⟩. ⟨hal-00786960⟩

  • Article dans une revue

The effect of gate length variation on InAlGaN/GaN HFET device characteristics

N. Ketteniss, H. Behmenburg, F. Lecourt, N. Defrance, Virginie Hoel, Jean-Claude de Jaeger, M. Heuken, H. Kalisch, A. Vescan

Semiconductor Science and Technology, 2012, 27, pp.035009-1-4. ⟨10.1088/0268-1242/27/3/035009⟩. ⟨hal-00788167⟩