Publicaciones
Affichage de 14091 à 14100 sur 16474
Analysis of hot carrier aging degradation in GaN MESFETs
R. Pierobon, F. Rampazzo, D. Pacetta, Christophe Gaquière, D. Theron, B. Boudart, G. Meneghesso, E. Zanoni
2004, pp.143-146. ⟨hal-00141969⟩
Raman characterization of Mg<sup>+</sup> ion-implanted GaN
B. Boudart, Y. Guhel, J.C. Pesant, P. Dhamelincourt, M.A. Poisson
Electrical characterization of Au/n-GaN Schottky diodes.
B. Akkal, Z. Benamara, H. Abid, A. Talbi, Bernard Gruzza
Materials Chemistry and Physics, 2004, pp.31. ⟨hal-00272575⟩
On-wafer high frequency noise power measurements under cryogenic conditions : a new de-embedding approach [HEMT example]
S. Delcourt, Gilles Dambrine, Nour Eddine Bourzgui, Sylvie Lepilliet, C. Laporte, J.P. Fraysse, M. Maignan
2004, pp.913-916. ⟨hal-00154887⟩
3 bit 90° phase shifter using microfluidic technology
L. Le Cloirec, A. Benlarbi-Delai, Bertrand Bocquet
34th European Microwave Conference, Oct 2004, Amsterdam, Netherlands. pp.1161-1164. ⟨hal-00142282⟩
Modelisation et simulation de la technlogie MOS ultimes
E. Lampin, Christophe Krzeminski, T. Alkalin, V. Cuny
GDR Nanoélectronique, 2004, Aussois, France. ⟨hal-00140992⟩
Etude théorique et modélisation d'une source piézoélectrique enterrée unidirectionnelle pour applications sismiques
Madjid Berraki
2004. ⟨hal-00162765⟩
Residual stress profiling of an aluminum alloy by laser ultrasonics
Y. Pan, M. Qian, Wei-Jiang Xu, Mohamed Ourak
Acta Acustica united with Acustica, 2004, 29, pp.254-257. ⟨hal-00162794⟩
Optimisation d'une technique 3D pour la réalisation de circuits intégrés millimétriques sur substrat de silicium
G. Six
2004. ⟨hal-00162764⟩
Adsorption of PTCDA on Si(100) and Si(100)-H
T. Soubiron, Francois Vaurette, B. Grandidier, X. Wallart, J.P. Nys, D. Stievenard
NSTI Nanotechnology Conference and Trade Show, 2004, United States. pp.3/383-386. ⟨hal-00248093⟩