Publicaciones
Affichage de 15691 à 15700 sur 16472
MBE growth of InAs dots on InAlAs and InGaAs buffers lattice mismatched on GaAs
Y. Cordier, P. Miska, D. Ferre
Proceedings of the 11th International Conference on Molecular Beam Epitaxy, MBE XI, 2000, Beijing, China. ⟨hal-00158218⟩
Electronic structure and rectification properties of a molecular diode
Christophe Krzeminski, Christophe Delerue, Guy Allan, Dominique Vuillaume, Robert M Metzger
Asia-Pacific Surface and Interface Analysis Conference, APSIAC 2000, 2000, Beijing, China. ⟨hal-00158953⟩
Théorie du transport électronique d'une diode moléculaire à base de quinolinium tricyanoquinodimethanide
Christophe Krzeminski, Christophe Delerue, Dominique Vuillaume, Guy Allan
7èmes Journées de la Matière Condensée, 2000, Poitiers, France. ⟨hal-00158948⟩
In situ deposition of sputtered PZT films: control of the growth temperature by the sputtered lead flux
G. Velu, Denis Remiens
Vacuum, 2000, 56, pp.199-204. ⟨hal-00158556⟩
Time frequency analysis of impact-echo signals : numerical modelling and experimental validation
O. Abraham, C. Leonard, P. Cote, Bogdan Piwakowski
Materials Journal, 2000, 97, pp.645-657. ⟨hal-00250444⟩
Modeling of Lamb waves generated by integrated transducers in composite plates using a coupled finite element-normal modes expansion method
Emmanuel Moulin, Jamal Assaad, Christophe Delebarre, D. Osmont
Journal of the Acoustical Society of America, 2000, 107, pp.87-94. ⟨hal-00159070⟩
Interferometric positioning systems by microwaves
A. Benlarbi Delai, J.C. Cousin, R. Ringot, A. Mamouni, Y. Leroy
Microwave Symposium 2000, 2000, Tetouan, Morocco. ⟨hal-00158188⟩
Monte Carlo method for the investigation of electron diffusion in degenerate semiconductors
P. Borowik, Jean-Luc Thobel
Journal of Applied Physics, 2000, 87, pp.329-333. ⟨hal-00158196⟩
Matériaux à gap de photons reconfigurables
J. Danglot, O. Vanbésien, D. Lippens
6èmes Journées Caractérisation Microonde et Matériaux, JCMM 2000, 2000, Paris, France. ⟨hal-00158230⟩
Composition effect on the growth mode, strain relaxation and critical thickness of tensile Ga1-xInxP layers
X. Wallart, O. Schuler, D. Deresmes, F. Mollot
Applied Physics Letters, 2000, 76, pp.2080-2082. ⟨hal-00158231⟩