Publicaciones

Affichage de 13931 à 13940 sur 16125


  • Communication dans un congrès

Novel 2D interfaces for nanoelectrospray mass spectrometry

S. Arscott, S. Le Gac, C. Druon, P. Tabourier, C. Rolando

2004, pp.316-319. ⟨hal-00140770⟩

  • Article dans une revue

AlGaN/GaN HEMTs on Si with power density performance of 1.9 W/mm at 10 GHz

A. Minko, Virginie Hoel, E. Morvan, B. Grimbert, A. Soltani, E. Delos, D. Ducatteau, Christophe Gaquière, D. Theron, Jean-Claude de Jaeger, H. Lahreche, L. Wedzikowski, R. Langer, P. Bove

IEEE Electron Device Letters, 2004, 25, pp.453-455. ⟨hal-00141952⟩

  • Autre publication scientifique

Mise en œuvre de l'épitaxie par jets moléculaires pour la synthèse de diamant monocristallin

T. Gehin

2004. ⟨hal-00133960⟩

  • Communication dans un congrès

Nonlinear noise modeling in FETs for the design of low noise active mixers

Francois Danneville

IEEE MTT-S International Microwave Symposium, Workshop on System-Level Measurement, Modelling, and Design Issues of Mixers, 2004, Fort Worth, TX, United States. ⟨hal-00133911⟩

  • Communication dans un congrès

Analytical transport model of AlGaN/GaN HEMT based on electrical and thermal measurement

Jean-Claude Jacquet, Raphaël Aubry, H. Gerard, E. Delos, Nathalie Rolland, Yvon Cordier, A. Bussutil, Michel Rousseau, Sylvain Laurent Delage

GaN and its related alloys constitute a family of wide bandgap semiconductors suitable to optoelectronics and power microwave applications. For the latter applications, their high breakdown fields in the 3MV/cm range and their high peak electron velocity above 107cm/s are crucial. The high electron...

12th European Gallium Arsenide and other compound semiconductors application symposium, Oct 2004, Amsterdam, Netherlands. pp.235-238. ⟨hal-00142308⟩

  • Article dans une revue

PZT polarization voltage effects on off-centered PZT patch actuating silicon membrane

M. Guirardel, C. Bergaud, Eric Cattan, Denis Remiens, B. Belier, S. Petitgrand, A. Bosseboeuf

Sensors and Actuators A: Physical , 2004, 110, pp.385-389. ⟨hal-00141180⟩

  • Article dans une revue

Electric force microscopy of individually charged semiconductor nanoparticles on conductive substrates : an analytical model for quantitative charge imaging

Thierry Melin, H. Diesinger, D. Deresmes, D. Stievenard

Physical Review B: Condensed Matter and Materials Physics (1998-2015), 2004, 69, pp.035321/1-8. ⟨hal-00141248⟩

  • Article dans une revue

Coupling of atom-by-atom calculations of extended defects with B kick-out equations : application to the simulation of boron TED

E. Lampin, Fuccio Cristiano, Y. Lamrani, B. Colombeau

Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, 2004, 216, pp.95-99. ⟨hal-00140975⟩