Publicaciones

Affichage de 14511 à 14520 sur 16309


  • Communication dans un congrès

Grazing incidence diffraction anomalous fine structure : a tool for investigating strain distribution and interdiffusion in InAs/InP quantum wires

A. Letoublon, Hubert Renevier, M.G. Proietti, C. Priester, M.L. Gonzalez, J.M. Garcia

2003, pp.541-542. ⟨hal-00149938⟩

  • Article dans une revue

Ultrasonic monitoring of sol-gel transition of natural hydrocolloids

Malika Toubal, Bertrand Nongaillard, Edouard Radziszewski, P. Boulenguer, V. Langendorf

Journal of Food Engineering, 2003, 58, pp.1-4. ⟨hal-00149904⟩

  • Article dans une revue

An experimental and theoretical investigation of the GaInAs surface reactivity to phosphorus

X. Wallart, C. Priester

Physical Review B: Condensed Matter and Materials Physics (1998-2015), 2003, 68, pp.235314. ⟨hal-00018497⟩

  • Article dans une revue

Influence of residual air gaps on the characteristics of circular polarization aperture-coupled millimeter wave microstrip antennas

Ronan Sauleau, Philippe Coquet

Electronics Letters, 2003, 39 (12), pp.889-891. ⟨hal-00549359⟩

  • Article dans une revue

Radiation characteristics and performances of millimeter wave horn-fed gaussian beam antennas

Ronan Sauleau, Philippe Coquet, Daniel Thouroude, J.P. Daniel, T. Matsui

IEEE Transactions on Antennas and Propagation, 2003, 51 (3), pp.378-387. ⟨hal-00549357⟩

  • Article dans une revue

Beam focusing using 60-GHz Fabry-Perot resonators with uniform and non-uniform metal grids

Ronan Sauleau, Philippe Coquet, Daniel Thouroude, J.P. Daniel

Electronics Letters, 2003, 39 (4), pp.341-342. ⟨hal-00549353⟩

  • Communication dans un congrès

Electro-optical probe dedicated to the on-line testing of electronic systems

B. Pannetier, P. Lemaitre-Auger, S. Tedjini, El Hadj Dogheche, Denis Remiens

2003, pp.275. ⟨hal-00162741⟩

  • Communication dans un congrès

Evaluation de la dégradation de béton par ondes ultrasonores haute fréquence

Bogdan Piwakowski, M. Goueygou, S. Ould-Naffa, F. Buyle-Bodin

GDR Ondes, Contrôle non destructif, 2003, Paris, France. ⟨hal-00250186⟩

  • Communication dans un congrès

Transmission electron microscopy analysis of silicides used in ALSB-SOI MOSFET structures

J. Katcki, J. Ratajczak, A. Laszcz, F. Phillipp, Emmanuel Dubois, Guilhem Larrieu, Julien Penaud, Xavier Baie

In Accumulated Low Schottky Barrier metal oxide semiconductor field effect transistors (MOSFET) on SOl structures, very thin silicide layers are used for ohmic contacts. Silicide contacts form due to metallurgical reaction of metal with semiconductor. In order to get a broad vision of the most...

Conference on Microscopy of Semiconducting Materials, Mar 2003, Cambridge, United Kingdom. pp.479-482, ⟨10.1201/9781351074636-110⟩. ⟨hal-00250182⟩