Publicaciones
Affichage de 14511 à 14520 sur 16309
Grazing incidence diffraction anomalous fine structure : a tool for investigating strain distribution and interdiffusion in InAs/InP quantum wires
A. Letoublon, Hubert Renevier, M.G. Proietti, C. Priester, M.L. Gonzalez, J.M. Garcia
2003, pp.541-542. ⟨hal-00149938⟩
Ultrasonic monitoring of sol-gel transition of natural hydrocolloids
Malika Toubal, Bertrand Nongaillard, Edouard Radziszewski, P. Boulenguer, V. Langendorf
Journal of Food Engineering, 2003, 58, pp.1-4. ⟨hal-00149904⟩
An experimental and theoretical investigation of the GaInAs surface reactivity to phosphorus
X. Wallart, C. Priester
Physical Review B: Condensed Matter and Materials Physics (1998-2015), 2003, 68, pp.235314. ⟨hal-00018497⟩
Influence of residual air gaps on the characteristics of circular polarization aperture-coupled millimeter wave microstrip antennas
Ronan Sauleau, Philippe Coquet
Electronics Letters, 2003, 39 (12), pp.889-891. ⟨hal-00549359⟩
Radiation characteristics and performances of millimeter wave horn-fed gaussian beam antennas
Ronan Sauleau, Philippe Coquet, Daniel Thouroude, J.P. Daniel, T. Matsui
IEEE Transactions on Antennas and Propagation, 2003, 51 (3), pp.378-387. ⟨hal-00549357⟩
Beam focusing using 60-GHz Fabry-Perot resonators with uniform and non-uniform metal grids
Ronan Sauleau, Philippe Coquet, Daniel Thouroude, J.P. Daniel
Electronics Letters, 2003, 39 (4), pp.341-342. ⟨hal-00549353⟩
Path delay model based on alpha-stable distribution for the 60 GHz indoor channel
Nourddine Azzaoui, Laurent Clavier, Rachid Sabre
Proceeding of Global Telecommunications Conference, 2003, Volume 3, pp.1638 - 1643 vol.3. ⟨10.1109/GLOCOM.2003.1258515⟩. ⟨hal-00255952⟩
Electro-optical probe dedicated to the on-line testing of electronic systems
B. Pannetier, P. Lemaitre-Auger, S. Tedjini, El Hadj Dogheche, Denis Remiens
2003, pp.275. ⟨hal-00162741⟩
Evaluation de la dégradation de béton par ondes ultrasonores haute fréquence
Bogdan Piwakowski, M. Goueygou, S. Ould-Naffa, F. Buyle-Bodin
GDR Ondes, Contrôle non destructif, 2003, Paris, France. ⟨hal-00250186⟩
Transmission electron microscopy analysis of silicides used in ALSB-SOI MOSFET structures
J. Katcki, J. Ratajczak, A. Laszcz, F. Phillipp, Emmanuel Dubois, Guilhem Larrieu, Julien Penaud, Xavier Baie
Conference on Microscopy of Semiconducting Materials, Mar 2003, Cambridge, United Kingdom. pp.479-482, ⟨10.1201/9781351074636-110⟩. ⟨hal-00250182⟩