Publicaciones

Affichage de 6211 à 6220 sur 16278


  • Communication dans un congrès

Contenu spectral haute fréquence des bruits conduits générés par un arc électrique en régime d'arc tracking : méthodologie de mesure et générateur équivalent à l'arc

Virginie Degardin, L. Kone, Flavien Valensi, Pierre Laly, M. Lienard, Pierre Degauque

18ème Colloque International et Exposition sur la Compatibilité ÉlectroMagnétique (CEM 2016), 11-13 Juillet 2016, Rennes (FRANCE), 2016, Rennes, France. ⟨hal-03989336⟩

  • Communication dans un congrès

Modeling and simulation of the vertical take off and energy consumption of a vibrating wing nano air vehicle

Le Anh Doan, Damien Faux, Samuel Dupont, Eric Cattan, Sébastien Grondel

Considering the advantages of size and robustness in performing different kinds of task, many researches on tiny flying robots have been developed in recent years. Our main objective is to develop an autonomous and bio-inspired vibrating wing nano-air-vehicle of about 3cm in wingspan relying mainly...

11th France-Japan Congress / 9th Europe-Asia Congress on Mechatronics (MECATRONICS) / 17th International Conference on Research and Education in Mechatronics (REM), Jun 2016, Compiegne, France. ⟨10.1109/MECATRONICS.2016.7547127⟩. ⟨hal-03280232⟩

  • Autre publication scientifique

Advances in Historical Studies [Editor in Chief 5/1]

Raffaele Pisano

2016. ⟨hal-04511030⟩

  • Communication dans un congrès

Estimation of an approximated likelihood ratio for iterative decoding in impulsive environment

Vincent Dimanche, Alban Goupil, Laurent Clavier, Guillaume Gelle

IEEE Wireless Communications and Networking Conference (WCNC), 2016, Doha, Qatar. pp.1-6, ⟨10.1109/WCNC.2016.7565031⟩. ⟨hal-02088568⟩

  • Communication dans un congrès

Modeling transistor level masking of soft errors in combinational circuits

Ihsen Alouani, Smail Niar, Yassin El Hillali, Atika Rivenq

Technology scaling in modern electronic circuits shrinks the transistor size and dramatically increases the sensitivity of semiconductor devices to radiations. Consequently, soft errors emerged as a serious reliability threat in both sequential and combinational circuits. To accurately estimate...

2015 IEEE East-West Design and Test Symposium, EWDTS 2015, Sep 2015, Batumi, United States. pp.7493140, ⟨10.1109/EWDTS.2015.7493140⟩. ⟨hal-03528693⟩