Publicaciones

• Article dans une revue

Correlation between hysteresis phenomena and hole-like trap in capacitance-voltage characteristics of AlGaN/GaN of Schottky barrier diode

M. Gassoumi, S. Saadaoui, M.M. Ben Salem, Christophe Gaquière, H. Maaref

European Physical Journal: Applied Physics, 2011, 55, pp.30101-1-4. ⟨10.1051/epjap/2011110136⟩. ⟨hal-00639884⟩

• Article dans une revue

Low-noise microwave performance of AlN/GaN HEMTs grown on silicon substrate

F Medjdoub, Nicolas Waldhoff, Malek Zegaoui, B. Grimbert, N. Rolland, Paul-Alain Rolland

Microwave noise performance of state-of-the-art AlN/GaN high-electron-mobility transistors (HEMTs) grown on 100-mm Si substrate has been investigated. DC and RF measurements show the outstanding potential of this structure for high-power millimeter-wave (mmW) applications. A maximum output current...

IEEE Electron Device Letters, 2011, 32 (9), pp.1230-1232. ⟨10.1109/LED.2011.2161261⟩. ⟨hal-00639806⟩

• Article dans une revue

InAs/AlSb HEMTs for cryogenic LNAs at ultra-low power dissipation

G. Moschetti, N. Wadefalk, P.A. Nilsson, Yannick Roelens, A. Noudeviwa, L. Desplanque, X. Wallart, Francois Danneville, Gilles Dambrine, S. Bollaert, J. Grahn

Solid-State Electronics, 2011, 64, pp.47-53. ⟨10.1016/j.sse.2011.06.048⟩. ⟨hal-00639807⟩

• Article dans une revue

Effect of dimensional parameters on the current of MSM photodetector

Abdel-Djawad Boumediène Zebentout, Zouaoui Bensaad, Abdelkader Aissat, Didier Decoster

In this work, we present the influence of dimensional parameters on dark current and photocurrent of the metal–semiconductor–metal photodetector (MSM). MSM photodetectors of different sizes have been fabricated on GaAs (NID). The active area of MSM samples varies between 1×1 μm2 and 10×10 μm2 with...

Microelectronics Journal, 2011, 42, pp.1006-1009. ⟨10.1016/j.mejo.2011.05.002⟩. ⟨hal-00639881⟩

• Article dans une revue

Conception of patch antenna at wide band

M. Iftissane, S. Bri, L. Zenkouar, A. Mamouni

International Journal of Emerging Sciences, 2011, 1, pp.400-417. ⟨hal-00639914⟩

• Article dans une revue

Opposition control with arrayed actuators in the near-wall region of a spatially-developing turbulent boundary layer

M. Pamies, E. Garnier, A. Merlen, P. Sagaut

International Journal of Heat and Fluid Flow, 2011, 32, pp.621-630. ⟨10.1016/j.ijheatfluidflow.2011.03.005⟩. ⟨hal-00597083⟩

• Article dans une revue

Golden ratio-based and tapered diptera inspired wings : their design and fabrication using standard MEMS technology

X.Q. Bao, Eric Cattan

Journal of Bionic Engineering, 2011, 8, pp.174-180. ⟨10.1016/S1672-6529(11)60023-1⟩. ⟨hal-00603032⟩

• Article dans une revue

Optical and electrochemical properties of tunable host-guest complexes linked to plasmonic interfaces

Fatiha Barka-Bouaifel, Joanna Niedziółka-Jönsson, Xavier Castel, Ophélie Saison-Francioso, Abdellatif Akjouj, Yan Pennec, Bahram Djafari-Rouhani, Patrice Woisel, Joël Lyskawa, Léna Sambe, Graeme Cooke, Nacer Bezzi, Rabah Boukherroub, Sabine Szunerits

This article describes the use of localized surface plasmon resonance (LSPR) interface to detect complexation/decomplexation steps of a controllable host–guest system at the solid–liquid interface. The LSPR interfaces consist of a sandwiched structure comprising a tin-doped indium oxide (ITO)...

Journal of Materials Chemistry, 2011, 21 (9), pp.3006-3013. ⟨10.1039/c0jm03293j⟩. ⟨hal-00579079⟩

• Communication dans un congrès

Frictional contact of two spheres for arbitrary 2D loading : memory diagrams and Preisach analysis

Vladislav Aleshin, Koen van den Abeele

XVI International Conference on Nonlinear Elasticity in Materials, ICNEM 2011, 2011, Prague, Czech Republic. pp.045004-1-11, ⟨10.1121/1.3670734⟩. ⟨hal-00819453⟩

• Communication dans un congrès

Silicon High Frequency Test Structures Improvement for Millimeter Wave Varactors Characterization Optimization and Modeling

F. Sonnerat, R. Debroucke, Y. Morandini, D. Gloria, Jean-Daniel Arnould

Silicon High Frequency Test Structures Improvement for Millimeter Wave Varactors Characterization Optimization and Modeling". IEEE International Conference on Microelectronic Test Structures (ICMTS), Apr 2011, Amsterdam, Netherlands. ⟨hal-01068863⟩