Publicaciones
Affichage de 15691 à 15700 sur 16459
New applicator used in the microwave thermochemotherapy of the bladder carcinoma
Alain Dietsch, J.C. Camart, J. Pribetich, Maurice Chive
Proceedings of the 8th International Congress on Hyperthermic Oncology, Apr 2000, Kyong-Ju, South Korea. ⟨hal-00158177⟩
InAs dots grown by MBE on InAIAs and InGaAs lattice mismatched buffers on GaAs
Y. Cordier, D. Ferre, P. Miska
Proceedings of the 42nd Electronic Materials Conference, Jun 2000, Denver, CO, United States. ⟨hal-00158219⟩
Mechanism of polariton-stimulation in a CdTe-based microcavity
F. Boeuf, R. Andre, R. Romestain, L.S. Dang, Emmanuel Peronne, Jean-Francois Lampin, D. Hulin, Antigoni Alexandrou
Physica Status Solidi A (applications and materials science), 2000, 178, pp.129-132. ⟨hal-00158229⟩
Development of microwave moisture measurement systems around microstrip complex correlators
T. Lasri, D. Glay, A. Mamouni, Y. Leroy
BALTES H., GÖPEL W., HESSE J. Sensors update, Volume 7, Wiley, pp.233-248, 2000. ⟨hal-00132335⟩
High anisotropic conductivity in organic insulator/semiconductor monolayer heterostructure
J. Collet, S. Lenfant, D. Vuillaume, O. Bouloussa, F. Rondelez, J.M. Gay, K. Kharn, C. Chevrot
Applied Physics Letters, 2000, 76, pp.1339-1341. ⟨hal-00158476⟩
On-chip microfluidics proteomitic analysis by electrospray ionization/mass spectrometry
P. Tabourier, C. Druon, C. Rolando, P. Lefebvre
2000, pp.439-444. ⟨hal-00158482⟩
FECTED oscillator optronic application feasibility
F. Driouch, M.R. Friscourt, Christophe Dalle
Solid-State Electronics, 2000, 44, pp.1455-1461. ⟨hal-00005313⟩
Rugged infrared sensors for use in safety-related industrial environnement
Abel Ebongue, Franck Brachelet, Frédéric Polet, Bruno Bêche, Etienne Gaviot
Proceeding of the 6th International Workshop on thermal investigations of Ics and Systems, 2000, Budapest, Hungary. ⟨hal-01554375⟩
2D hydrodynamic energy model including breakdown phenomen for power field effect transistors
Michel Rousseau, Jean-Claude de Jaeger
2000, pp.110-111. ⟨hal-00158998⟩
Investigation of FET's avalanche breakdown phenomenon by means of a 2 D hydrodynamic energy model
Michel Rousseau, M. El Khou, Jean-Claude de Jaeger
12th III-V Semiconductor Device Simulation Workshop, 2000, Duisburg, Germany. ⟨hal-00159028⟩