Publicaciones

• Article dans une revue

Negative refraction of surface acoustic waves in the subgigahertz range

Bernard Bonello, Laurent Belliard, Juliette Pierre, Jerome O. Vasseur, Bernard Perrin, Olga Boyko-Kazymyrenko

We used the picosecond ultrasonic technique to experimentally demonstrate the negative refraction of surface acoustic waves in a two-dimensional phononic crystal. The sample is made of a square lattice of circular voids drilled at the surface of a thick silica substrate. The lattice parameter is of...

Physical Review B: Condensed Matter and Materials Physics (1998-2015), 2010, 82, pp.104109-1-5. ⟨10.1103/PhysRevB.82.104109⟩. ⟨hal-00549435⟩

• Article dans une revue

Bottom and top electrodes nature and PZT film thickness influence on electrical properties

N. Sama, Caroline Soyer, Denis Remiens, C. Verrue, R. Bouregba

Sensors and Actuators A: Physical , 2010, 158, pp.99-105. ⟨10.1016/j.sna.2009.11.032⟩. ⟨hal-00549503⟩

• Article dans une revue

Growth and electric properties of MPB BiScO3-PbTiO3 thin films on La0.7Sr0.3MnO3-coated silicon substrates

S.A. Zhang, X.L. Dong, Y. Chen, F. Cao, Y.Y. Zhang, G.S. Wang, N. Sama, Denis Remiens

Journal of the American Ceramic Society, 2010, 93, pp.1583-1585. ⟨10.1111/j.1551-2916.2010.03630.x⟩. ⟨hal-00549506⟩

• Article dans une revue

Time-resolved charge detection and back-action in quantum circuits

T. Ihn, S. Gustavsson, U. Gasser, R. Leturcq, I. Shorubalko, K. Ensslin

Physica E: Low-dimensional Systems and Nanostructures, 2010, 42, pp.803-808. ⟨10.1016/j.physe.2009.11.087⟩. ⟨hal-00568568⟩

• Communication dans un congrès

Vers la caractérisation cellulaire par BioMEMS THz

Simon Laurette, A. Treizebre, Nour Eddine Bourzgui, Bertrand Bocquet

13èmes Journées Nationales du Réseau Doctoral en Microélectronique, JNRDM 2010, Jan 2010, Paris, France. CD-ROM, Session MEMS Lab-on-chip, 1-4. ⟨hal-00573235⟩

• Article dans une revue

Parasitic effects and traps in AlGaN/GaN HEMT on sapphire substrate

O. Fathallah, M. Gassoumi, B. Grimbert, Christophe Gaquière, H. Maaref

European Physical Journal: Applied Physics, 2010, 51, pp.10304-1-5. ⟨10.1051/epjap/2010085⟩. ⟨hal-00549476⟩

• Article dans une revue

Transmission electron microscopy study of erbium silicide formation from Ti/Er stack for Schottky contact applications

J. Ratajczak, A. Laszcz, A. Czerwinski, J. Katcki, F. Phillipp, P.A. van Aken, N. Reckinger, Emmanuel Dubois

In this paper, we present results of transmission electron microscopy studies on erbium silicide structures fabricated under various thermal conditions. A titanium cap has been used as a protective layer against oxidation during rapid thermal annealing of an erbium layer in a temperature range of...

Journal of Microscopy, 2010, EM 2008 ‐ XIII International Conference on Electron Microscopy, 237 (3), pp.379-383. ⟨10.1111/j.1365-2818.2009.03264.x⟩. ⟨hal-00549623⟩

• Article dans une revue

Negative refraction of zero order flexural Lamb waves through a two-dimensional phononic crystal

Juliette Pierre, Olga Boyko-Kazymyrenko, Laurent Belliard, Jerome O. Vasseur, Bernard Bonello

We investigate experimentally the refraction of antisymmetric Lamb waves at frequencies in the second band of a two-dimensional phononic crystal. The heterostructure is made of a square lattice of air inclusions in a silicon plate. Our experimental scheme is based on the selective generation of...

Applied Physics Letters, 2010, 97 (12), pp.121919. ⟨10.1063/1.3491290⟩. ⟨hal-00549436⟩

• Article dans une revue

Piezoelectric-actuated, piezoresistive-sensed circular micromembranes for label-free biosensing applications

Thomas Alava, Fabrice Mathieu, P. Rameil, Y. Morel, Caroline Soyer, Denis Remiens, Liviu Nicu

Applied Physics Letters, 2010, 97, pp.093703-1-3. ⟨10.1063/1.3486112⟩. ⟨hal-00567894⟩

• Article dans une revue

Characterization of ytterbium silicide formed in ultra high vacuum

Adam Laszcz, Jacek Ratajczak, Andrzej Czerwinski, Jerzy Katcki, Vesna Srot, Fritz Phillipp, Peter A. van Aken, Dmitri Yarekha, Nicolas Reckinger, Guilhem Larrieu, Emmanuel Dubois

The formation of ytterbium silicide fabricated by annealing at 480 °C for one hour has been studied by means of high resolution transmission electron microscopy (HRTEM) and energy dispersive X-ray spectroscopy (EDS). The annealing process has been performed under ultra high vacuum (UHV) conditions...

Journal of Physics: Conference Series, 2010, 209 : 16th International Conference on Microscopy of Semiconducting Materials, pp.012056 (1--4). ⟨10.1088/1742-6596/209/1/012056⟩. ⟨hal-00549559⟩