Publicaciones

Affichage de 11411 à 11420 sur 16279


  • Communication dans un congrès

[Invité] Caractérisation électrique de défauts atomiques uniques dans un semi-conducteur

B. Grandidier

Journées Nationales en Nanosciences et Nanotechnologies, J3N 2008, 2008, Grenoble, France. ⟨hal-00811728⟩

  • Communication dans un congrès

Scanning-probe measurements on undoped silicon nanowires

Lukasz Borowik, Heinrich Diesinger, D. Hourlier-Bahloul, Thierry Melin

Forum des Microscopies à Sonde Locale, 2008, La Londe les Maures, France. ⟨hal-00376238⟩

  • Article dans une revue

Metamorphic high electron mobility Te-doped AlInSb/GaInSb heterostructures on InP (001)

G. Delhaye, L. Desplanque, X. Wallart

Journal of Applied Physics, 2008, 104 (6), pp.066105. ⟨10.1063/1.2978365⟩. ⟨hal-00356944⟩

  • Article dans une revue

A Monte Carlo investigation of carrier transport in fabricated back-to-back Schottky diodes : influence of direct quantum tunnelling and temperature

E. Pascual, R. Rengel, N. Reckinger, Xing Tang, V. Bayot, Emmanuel Dubois, M.J. Martin

In this paper we present a Monte Carlo investigation of charge transport-including quantum tunnelling effects in fabricated back-to-back n-type Schottky barriers in the reverse bias regime. The effect of the variation of the temperature over the current density and over different internal...

Physica Status Solidi C: Current Topics in Solid State Physics, 2008, 15th International Conference on Nonequilibrium Carrier Dynamics in Semiconductors (HCTS‐15), 5 (1), pp.119-122. ⟨10.1002/pssc.200776519⟩. ⟨hal-04710009⟩

  • Article dans une revue

Magnesium diffusion profile in GaN grown by MOVPE

Z. Benzarti, I. Halidou, Z. Bougrioua, T. Boufaden, B. El Jani

Journal of Crystal Growth, 2008, 310, pp.3274-3277. ⟨10.1016/j.jcrysgro.2008.04.008⟩. ⟨hal-00356993⟩

  • Article dans une revue

Effect of gate length in InAs/AlSb HEMTs biased for low power or high gain

M. Borg, E. Lefebvre, M. Malmkvist, L. Desplanque, X. Wallart, Yannick Roelens, Gilles Dambrine, A. Cappy, S. Bollaert, J. Grahn

Solid-State Electronics, 2008, 52, pp.775-781. ⟨10.1016/j.sse.2007.12.002⟩. ⟨hal-00356942⟩