Publicaciones

• Communication dans un congrès

The effects of self-assembled monolayers gate dielectrics treatment on pentacene thin film transistor characteristics

K. Lmimouni, R. Bianchini, S. Lenfant, David Troadec, D. Vuillaume

Indo-French workshop on molecular and organic devices, 2006, Lille, France. ⟨hal-00127157⟩

• Article dans une revue

Power measurement setup for large signal microwave characterization at 94 GHz

F Medjdoub, S. Vandenbrouck, Christophe Gaquière, E. Delos, M. Zaknoune, D. Theron

IEEE Electron Device Letters, 2006, 16, pp.218-220. ⟨hal-00127945⟩

• Communication dans un congrès

Effets de contrainte sur la nucléation de boîtes quantiques de semiconducteurs sur substrat nanostructuré

C. Priester

10èmes Journées de la Matière Condensée, 2006, Toulouse, France. ⟨hal-00127065⟩

• Communication dans un congrès

Triple issues for triple junctions

F. Cleri

Metallphysikalisches Kolloquium am IMM (Institute of Physical Metallurgy and Metal Physics), 2006, Aachen, Germany. ⟨hal-00127949⟩

• Communication dans un congrès

Détection des marnières de Haute Normandie par sismique haute résolution

Bogdan Piwakowski, Lynda Driad-Lebeau, Arkadiusz Kosecki, Pawel Safinowski

Ce papier présente des exemples d'application de la sismique haute résolution à la détection et localisation des cavités souterraines qui résultent d'exploitation de marne et craie dans la région de Haute Normandie. Les vides se trouvent à profondeurs 35 - 40 m. L'investigation est..., This paper presents examples of application of the high resolution reflection seismics for the detection and localisation of underground voids which are old explorations of marl and chalk in Upper Normandy region in France. The voids occur at depths of 35-40 m. The survey is conducted using the...

Journées AGAP Qualité - GEOFCAN "Géophysique appliquée à la reconnaissance des cavités et des structures anthropiques", Nov 2006, Besançon, France. pp.28-31. ⟨ineris-00973240⟩

• Article dans une revue

Multiexponential photoluminescence decay in indirect-gap semiconductor nanocrystals

Christophe Delerue, Guy Allan, Cécile Reynaud, Olivier Guillois, Gilles Ledoux, Friedrich Huisken

The origin of the multiexponential photoluminescence (PL) decay of Si quantum dots (QDs) has been debated for a long time. We present studies combining time-resolved PL experiments and tight binding calculations of phonon-assisted optical transitions showing that the distribution of lifetimes and...

Physical Review B: Condensed Matter and Materials Physics (1998-2015), 2006, 73, pp.235318 1-4. ⟨10.1103/PhysRevB.73.235318⟩. ⟨hal-00092072⟩

• Communication dans un congrès

Victim and aggressor line electrical modelisation in an multicoupled interconnect environment for transient simulation

Freddy Ponchel, Jean-François Legier, Erick Paleczny, Christophe Seguinot, Denis Deschacht

2006, pp.249-251. ⟨hal-00162815⟩

• Communication dans un congrès

Full wave analysis and electrical modeling of eight copper interconnects placed in a giga-scale integrated environment for signal integrity evaluation

Freddy Ponchel, Jean-François Legier, Erick Paleczny, Christophe Seguinot, Denis Deschacht

2006, 6 pp. ⟨hal-00162816⟩

• Communication dans un congrès

Study of field plate AlGaN/GaN HEMTs by means of a 2D-hydrodynamic model for power applications

Brahim Benbakhti, Michel Rousseau, Jean-Claude de Jaeger

Field plate AlGaN/GaN HEMT (high electron mobility transistor) structures, are very promising to improve the microwave power performance. This device permits to improve the breakdown voltage but the field plate (FP) electrode involves an increase of the parasitic capacitances and consequently a...

European Microwave Integrated Circuits Conference, Sep 2006, Manchester, United Kingdom. 4 pp., ⟨10.1109/EMICC.2006.282657⟩. ⟨hal-00152973⟩

• Communication dans un congrès

40 nm PtSi-based Schottky-barrier p-MOSFETs with a midgap tungsten gate

Emmanuel Dubois, G. Larrieu

7th Symposium Diagnostics & Yield Advanced Silicon Devices and Technologies for ULSI Era, 2006, Warsaw, Poland. ⟨hal-00138697⟩