Publicaciones

• COMM

Influence des conditions climatiques sur les capteurs textiles à base de matériau conducteur nano composite

C. Cochrane, V. Koncar, M. H. Lewandowski, J. Belloncle, C. Dufour

Matériaux 2006, 2006, Dijon, France. ⟨hal-00243999⟩

• COMM

Développement d'un flextenseur piézoélectrique pour l'imagerie sismique

Bertrand Dubus, G. Haw, C. Granger, P. Mosbah, A. Kosecki, Bogdan Piwakowski, P. Meynier

8ème Congrès Français d'Acoustique, CFA2006, 2006, France. pp.159-162. ⟨hal-00240743⟩

• COMM

High speed single CCD schieren/shadowgraph camera

Y. Deblock, O. Ducloux, L. Derbesse, A. Merlen, Philippe Pernod

Proceedings of the 27th International Congress on High-Speed Photography and Photonics, 27th ICHSPP, 2006, Xian, Shaanxi, China. ⟨hal-00241073⟩

• COMM

New receiver architecture for localisation system

V.Y. Vu, A. Benlarbi-Delaï

International Symposium on Intelligent Signal Processing and Communication Systems, ISPACS 2006, 2006, Japan. pp.879-882, ⟨10.1109/ISPACS.2006.364782⟩. ⟨hal-00241357⟩

• COMM

Filtres pour télécommunications radio-fréquences par couplage acoustique de résonateurs

A. Volatier, E. Defaÿ, A. N'Hari, P. Ancey, M. Aïd, Bertrand Dubus

8ème Congrès Français d'Acoustique, CFA2006, 2006, France. pp.323-326. ⟨hal-00240735⟩

• ART

Mechanical properties measured by nanoindentation of Pb(Zr Ti)03 sol-gel films deposited on Pt and LaNi03 electrodes

Patrick Delobelle, G.S. Wang, E. Fribourg-Blanc, Denis Remiens

Surface and Coatings Technology, 2006, 201, pp. 3155-3162. ⟨hal-00159447⟩

• ART

TEM characterisation of the erbium silicide formation process using a Pt/Er stack on the silicon-on-insulator substrate

A. Łaszcz, J. Katcki, J. Ratajczak, Xing Tang, Emmanuel Dubois

Very thin erbium silicide layers have been used as source and drain contacts to n-type Si in low Schottky barrier MOSFETs on silicon-on-insulator substrates. Erbium silicide is formed by a solid-state reaction between the metal and silicon during annealing. The influence of annealing temperature (...

Journal of Microscopy, 2006, 224 (1), pp.38-41. ⟨10.1111/j.1365-2818.2006.01653.x⟩. ⟨hal-00138660⟩

• ART

Evaluation of the moisture content in phenolic resin via acoustic measurements

J. Fortineau, F. Vander Meulen, L. Haumesser, G. Feuillard, S. Barre, Olivier Bou Matar

Journal of Applied Physics, 2006, 100 (7), pp.074911. ⟨10.1063/1.2356787⟩. ⟨hal-00243826⟩

• ART

TEM study of PtSi contacts layers for low Schottky barrier MOSFETs

A. Laszcz, J. Katcki, J. Ratajczak, A. Czerwinski, N. Breil, G. Larrieu, Emmanuel Dubois

We report investigations of the silicide formation process in the Pt/Si structure of low Schottky barrier MOSFETs on SOI. The silicide layers are used there as source and drain contacts and the high quality of the silicide/Si interface and the silicide structure are essential for the electrical...

Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, 2006, 253 (1-2), pp.274-277. ⟨10.1016/j.nimb.2006.10.033⟩. ⟨hal-00138656⟩

• COUV

Rythmes de la sédimentation et interprétations paléoclimatiques lors du Postglaciaire dans les Alpes du Sud C et dendro-géomorphologie, deux chronomètres complémentaires

Olivier Sivan, Corinne Miramond, Jean-Louis Édouard

L'Erosion entre société, Climat et Paléoenvironnement., Presses universitaires Blaise-Pascal, s.p., 2006. ⟨halshs-00321976⟩