Publicaciones
Affichage de 13231 à 13240 sur 16175
Simulation Monte Carlo du transport quantique dans les dispositifs optoélectroniques à transistions inter-sous-bandes
Olivier Bonno, Jean-Luc Thobel, François Dessenne
1ères Journées du GDR Térahertz, 2005, Montpellier, France. ⟨hal-00125904⟩
Quanti sono i principi della termodinamica ? (How many principles thermodynamics has?)
Raffaele Pisano
La fisica nella scuola , XL (3), pp.203-211, 2005, Proceedings of XLIII AIF National Congress. ⟨hal-04515042⟩
Piezoelectric micro-transformer based on SOI structure
Dejan Vasic, Emmanuel Sarraute, François Costa, Patrick Sangouard, Eric Cattan
Sensors and Actuators A: Physical , 2005, 117 (2), pp.317-324. ⟨hal-00920231⟩
Optimisation de la correction de biais dans le récepteur PIC multi-étages pour le système CDMA
M. Moussaoui
2005. ⟨hal-00162808⟩
Power line communication, application to indoor and in-vehicule data transmission
Virginie Degardin, M. Olivas-Carrion, Pierre Laly, M. Lienard, Pierre Degauque
Proceedings of Cost 286 Meeting, 2005, Split, Croatia. ⟨hal-00140804⟩
Ultrasonic evaluation of residual stress in flat glass tempering by an original double interferometric detection
D. Devos, Marc Duquennoy, E. Romero, Frédéric Jenot, Dominique Lochegnies, Mohammadi Ouaftouh, Mohamed Ourak
Proceedings of the 2005 Joint World Congress on Ultrasonics/Ultrasonics International, WCU/UI'05, 2005, Beijing, China. ⟨hal-00140793⟩
Terahertz radiation from heavy-ion-irradiated In0.53Ga0.47As photoconductive antenna excited at 1.55 µm
N. Chimot, J. Mangeney, L. Joulaud, P. Crozat, H. Bernas, K. Blary, Jean-Francois Lampin
Applied Physics Letters, 2005, 87, pp.193510-1-3. ⟨hal-00162806⟩
Optimisation of HSQ e-beam lithography for the patterning of FinFET transistors
F. Fruleux, J. Penaud, Emmanuel Dubois, M. Francois, M. Muller
2005, pp.9C01. ⟨hal-00138404⟩
Close infrared thermography using an intensified CCD camera : application in nondestructive high resolution evaluation of electrothermally actuated MEMS
B. Serio, J.J. Hunsinger, F. Conseil, P. Derderian, D. Collard, L. Buchaillot, M.F. Ravat
2005, pp.819-829. ⟨hal-00147502⟩
Impact of the intrinsic parameters of the dielectric on the leakage current
G. Larrieu, M. Tao
2nd International Workshop on Advanced Gate Stack Technology, 2005, Austin, TX, United States. ⟨hal-00138407⟩