Publicaciones
Affichage de 13321 à 13330 sur 16181
Electronic properties of organic nanostructures
D. Vuillaume
Materials Research Society Fall Meeting, 2005, Boston, MA, United States. ⟨hal-00125617⟩
Another approach for partial interference cancellation
M. Mousaoui, M. Zaizouni, Jean-Michel Rouvaen
Proceedings of the 7th IFIP International Conference on Mobile and Wireless Communication Networks, MWCN 2005, 2005, Marrakech, Morocco. ⟨hal-00131353⟩
A theoretical study of the influence of the electric and polarization distribution on ferroelectric thin films switching properties
Laurent Baudry
Proceedings of the 17th International Symposium on Integrated Ferroelectrics, ISIF 2005, 2005, Shanghai, China. ⟨hal-00131333⟩
Dielectric behaviour and high electric breakdown field of short alkylchains
D. K. Aswal, S. Lenfant, David Guérin, J. V. Yakhmi, D. Vuillaume
8th European Conference on Molecular Electronic, ECME8, 2005, Bologna, Italy. ⟨hal-00125579⟩
Refractive index, sound velocity and thickness of thin transparent films from multiple angles picosecond ultrasonics
R. Cote, Arnaud Devos
Review of Scientific Instruments, 2005, 76, pp.053906. ⟨hal-00124475⟩
Application of phase conjugation of ultrasound in nondestructive testing of objects with corrugated surface
L. Krutyansky, Philippe Pernod, K. Yamamoto
Physics of Wave Phenomena, 2005, 13, pp.87-90. ⟨hal-00138389⟩
Multicouches magnétostrictives TbCo/FeCo pour applications microsystèmes
J. Juraszek, S. Masson, O. Ducloux, Nicolas Tiercelin, J. Teillet, Vladimir Preobrazhensky, Philippe Pernod
Congrès Général de la Société Française de Physique, 2005, Lille, France. ⟨hal-00138385⟩
Dry etchnig of PZT thin films for bilayer actuator realization
Caroline Soyer, E. Fribourg-Blanc, Eric Cattan, Denis Remiens
2005, pp.203-211. ⟨hal-00138428⟩
A Gm−C low−pass filter for zero−IF mobile applications with a very wide tuning range
D. Chamla, A. Kaiser, A. Cathelin, D. Belot
IEEE Journal of Solid-State Circuits, 2005, 40, pp.1443− 1450. ⟨hal-00138393⟩
Conjugaison de phase appliquée au CND
Philippe Pernod, Vladimir Preobrazhensky
Journée Technique Contrôle Non Destructif, 2005, Villeneuve d'Ascq, France. ⟨hal-00137669⟩