Publicaciones

Affichage de 13401 à 13410 sur 16055


  • COMM

A DCT-domain postprocessor for color bleeding removal

François-Xavier Coudoux, Marc G. Gazalet, Patrick Corlay

2005, pp.I-209. ⟨hal-00131105⟩

  • COMM

Enhancement of cutoff frequency in AlGaN/GaN high electron mobility transistors using a silicon nitride based T-gate technology

S. Touati, Virginie Hoel, A. Soltani, Jean-Claude de Jaeger, M.A. Poisson, S. Delage

Proceedings of the 16th European Conference on Diamond, Diamond-Like Materials, Carbon Nanotubes and Nitrides, Diamond 2005, 2005, Toulouse, France. ⟨hal-00131349⟩

  • COMM

Motion information scalability for SNR scalability

B. Timmerman, P. Amon, A. Hutter, François-Xavier Coudoux

Proceedings of the 2005 Visual Communications and Image Processing International Symposium, VCIP 2005, 2005, Beijing, China. ⟨hal-00131356⟩

  • COMM

Performances of concatenated coded OFDM over propagation channels suitable for high speed trains

M. Chennaoui, Marion Berbineau, Jamal Assaad, Atika Rivenq

Proceedings of the 5th International Conference on ITS Telecommunications, ITST-2005, 2005, Brest, France. ⟨hal-00131358⟩

  • OUV

Group-IV Semiconductor Nanostructures - Materials Research Society 2004 Fall Symposium Proceedings, volume 832

L. Tsybeskov, D.J. Lockwood, C. Delerue, M. Ichikawa

Materials Research Society, Warrendale, PA, USA, pp.F1.1 - F11.8, 2005. ⟨hal-00131730⟩

  • COMM

Monte Carlo simulation of terahertz quantum cascade lasers : the influence of the modelling of carrier-carrier scattering

Olivier Bonno, Jean-Luc Thobel, François Dessenne

Proceedings of the 15th Workshop on Modelling and Simulation of Electron Devices, 2005, Pisa, Italy. ⟨hal-00131334⟩

  • COMM

Compensation by design of thermal dilatation in RF MEMS switches

Q.H. Duong, X. Lafontan, D. Collard, L. Buchaillot, P. Schmitt, Patrick Pons, F. Flourens, F. Pressecq

2005, pp.190-194. ⟨hal-00128657⟩

  • ART

Thermal and electrostatic reliability characterization in RF MEMS switches

Q.H. Duong, L. Buchaillot, D. Collard, P. Schmitt, X. Lafontan, Patrick Pons, F. Flourens, F. Pressecq

Microelectronics Reliability, 2005, 45, pp.1790-1793. ⟨hal-00154911⟩