Publicaciones

Affichage de 13611 à 13620 sur 16055


  • COMM

Modelisation et simulation de la technlogie MOS ultimes

E. Lampin, Christophe Krzeminski, T. Alkalin, V. Cuny

GDR Nanoélectronique, 2004, Aussois, France. ⟨hal-00140992⟩

  • COMM

Quasi-particle gap, dielectric properties and electronic correlations in semiconductor nanostructures

Christophe Delerue, Michel Lannoo, Guy Allan

Workshop on Theory and Modeling of Electronic Excitations in Nanoscience, NANOEXC2004, 2004, Acquafredda di Maratea, Italy. ⟨hal-00141287⟩

  • COMM

Two-photon absorption in InP substrates in the 1.55 µm range

D. Vignaud, Jean-Francois Lampin, F. Mollot

2004, pp.134-137. ⟨hal-00140715⟩

  • COMM

THz study of liquids using an integrated bragg filter

Jean-Francois Lampin, L. Desplanque, M. Ternisien, T. Crepin, C. Walloth, D. Lippens, F. Mollot

2004, pp.469-470. ⟨hal-00140721⟩

  • COMM

Caractérisation de films d'alcènes greffés sur des surfaces Si(111) par analyse XPS résolue angulairement

X. Wallart, C. Henry de Villeneuve, P. Allongue

2004, pp.152-157. ⟨hal-00140723⟩

  • ART

Visualization of phase conjugate ultrasound waves passed through inhomogeneous layer

K. Yamamoto, Philippe Pernod, Vladimir Preobrazhensky

Ultrasonics, 2004, 42, pp.1049-1052. ⟨hal-00140728⟩

  • ART

A micro-nib nanoelectrospray source for mass spectrometry

S. Arscott, S. Le Gac, C. Druon, P. Tabourier, C. Rolando

Sensors and Actuators B: Chemical, 2004, 98 (2-3), pp.140-147. ⟨hal-00140771⟩

  • COMM

Silicon-molecules-metal junctions by nanotransfer printing

C. Merckling, David Guérin, S. Lenfant, D. Vuillaume

French-Japan Workshop on Nanomaterials, 2004, Bordeaux, France. ⟨hal-00140758⟩

  • COMM

Physical analysis of the breakdown phenomenon between single or double step gate recess HEMTs

M. Elkhou, Michel Rousseau, H. Gerard, Jean-Claude de Jaeger

2004, pp.571-574. ⟨hal-00142307⟩