Publicaciones
Affichage de 13671 à 13680 sur 16105
Low-loss InGaAsP/InP submicron optical waveguides fabricated by ICP etching
Samuel Dupont, Arnaud Beaurain, Patrice Miska, Malek Zegaoui, Jean-Pierre Vilcot, Hongwu Li, M. Constant, Didier Decoster, Jean Chazelas
Electronics Letters, 2004, 40, pp.865-866. ⟨hal-00141187⟩
Interpretation and reconstruction of Sadi Carnot’s Réflexions through original sentences belonging to non–classical logic
Antonino Drago, Raffaele Pisano
Atti della Fondazione Ronchi, 2004, LIX (5), pp.615-644. ⟨hal-04508054⟩
Application de la sismique réflexion pour la reconnaissance du sous-sol aux faibles profondeurs
Bogdan Piwakowski, T. Windal, C. Gomez
Actes des Journées Nationales de Géotechnique et de Géologie de l'Ingénieur, JNGGI 2004, 2004, Lille, France. ⟨hal-00247817⟩
Submicrometer InAlAs/InGaAs double-gate HEMT's on transferred substrate
Nicolas Wichmann, I. Duszynski, T. Parenty, S. Bollaert, J. Mateos, X. Wallart, A. Cappy
2004, pp.215-218. ⟨hal-00133903⟩
Terahertz emission by plasma waves in 60 nm gate high electron mobility transistors
W. Knap, J. Lusabowski, T. Parenty, S. Bollaert, A. Cappy, V.V. Popov, M.S. Shur
Applied Physics Letters, 2004, 84, pp.2331-2333. ⟨hal-00133879⟩
Design space exploration for analog IPs using Cairo+
R. Iskander, L. de Lamarre, A. Kaiser, M.M. Louerat
2004, pp.473 - 476. ⟨hal-00140990⟩
Reliability investigation of gallium nitride HEMT microelectronics reliability
A. Sozza, C. Dua, E. Morvan, B. Grimbert, Virginie Hoel, S.L. Delage, N. Chaturvedi, R. Lossy, J. Wuerfl
Microelectronics Reliability, 2004, 44, pp.1369-1373. ⟨hal-00141958⟩
Experimental analysis of a multi-conductor uniform line above soil for modelling a railway line
A. Cozza, F. Canavero, B. Demoulin, J.M. Bodson, V. Sabate, J.M. Vanzemberg
2004, pp.465-468. ⟨hal-00142009⟩
Study by ultrasound of the impact of technological parameters changes in the milk gelation process
Georges Nassar, Bertrand Nongaillard, Y. Noel
Journal of Food Engineering, 2004, 63, pp.229-236. ⟨hal-00142002⟩
Using low frequency noise characterization of AlGaN/GaN HEMT as a tool for technology assessment and failure prediction
Jean-Guy Tartarin, Geoffroy Soubercaze-Pun, Abdelali Rennane, Laurent Bary, Jean-Claude de Jaeger, Marie Germain, S. Delage, Robert Plana, Jacques Graffeuil
Using low frequency noise characterization of AlGaN/GaN HEMT as a tool for technology assessment and failure prediction . 2004, pp.296-306. ⟨hal-00141968⟩