Publicaciones

• COMM

On the modelling of transient diffusion and activation of boron during post-implantation annealing

P. Pichler, C.J. Ortiz, B. Colombeau, N.E.B. Cowern, E. Lampin, Alain Claverie, Fuccio Cristiano, W. Lerch, S. Paul

International Electron Devices Meeting, IEDM 2004, 2004, San Francisco, CA, United States. ⟨hal-00141013⟩

• COMM

Potentiel d'échange et de corrélation dans des nanostructures de semiconducteurs

Christophe Delerue, Guy Allan, Michel Lannoo

Réunion du GDR-DFT, 2004, La Londe Les Maures, France. ⟨hal-00141288⟩

• COMM

Guides nanophotoniques III-V/polymère

D. Lauvernier, Joseph Harari, Jean-Pierre Vilcot, Didier Decoster

2004, pp.221-223. ⟨hal-00141203⟩

• ART

Determination of carrier-induced optical index and loss variations in GaInAsP/InP heterostructures from static and dynamic Mach-Zehnder interferometer measurements

Malek Zegaoui, Joseph Harari, Jean-Pierre Vilcot, F. Mollot, Didier Decoster, H. Li, Jean Chazelas

Mach-Zehnder type interferometer measurements are used to determine the variation of the optical index and propagation loss. Devices are fabricated in InGaAsP/InP material line and experiments are performed at 1.3 and 1.55 μm wavelength. Combining static and dynamic measurements, the carrier life-...

Electronics Letters, 2004, 40 (16), pp.1019-1020. ⟨10.1049/el_20045539⟩. ⟨hal-00141174⟩

• ART

Piezoelectric micro-transformer based on PZT unimorph membrane

D. Vasic, Emmanuel Sarraute, F. Costa, P. Sangouard, Eric Cattan

Journal of Micromechanics and Microengineering, 2004, 14, pp.S90-S96. ⟨hal-00141177⟩

• ART

Ideal subthreshold characteristics of thin-film SOI p-MOSFETs with Schottky source/drain and a midgap tungsten gate

G. Larrieu, Emmanuel Dubois

IEE Proceedings Microwaves Antennas and Propagation, 2004, 25, pp.801-803. ⟨hal-00140978⟩

• COMM

Design space exploration for analog IPs using Cairo+

R. Iskander, L. de Lamarre, A. Kaiser, M.M. Louerat

2004, pp.473 - 476. ⟨hal-00140990⟩

• COMM

Using low frequency noise characterization of AlGaN/GaN HEMT as a tool for technology assessment and failure prediction

Jean-Guy Tartarin, Geoffroy Soubercaze-Pun, Abdelali Rennane, Laurent Bary, Jean-Claude de Jaeger, Marie Germain, S. Delage, Robert Plana, Jacques Graffeuil

Using low frequency noise characterization of AlGaN/GaN HEMT as a tool for technology assessment and failure prediction . 2004, pp.296-306. ⟨hal-00141968⟩

• COMM

Experimental analysis of a multi-conductor uniform line above soil for modelling a railway line

A. Cozza, F. Canavero, B. Demoulin, J.M. Bodson, V. Sabate, J.M. Vanzemberg

2004, pp.465-468. ⟨hal-00142009⟩

• COMM

Use of crosstalk coupling to test the susceptibility of electronic components in wide frequency range

S. Bazzoli, B. Demoulin, M. Cauterman, P. Hoffmann

2004, pp.47-51. ⟨hal-00142021⟩