Publicaciones
Affichage de 13741 à 13750 sur 16058
Mode stirred chambers for simulating MIMO channels
M. Lienard, Pierre Laly, Pierre Degauque
Proceedings of the COST 273 Meeting, 2004, Athenes, Greece. ⟨hal-00142317⟩
Electromagnetic susceptibility of IC's due to HPM coupling
S. Bazzoli, B. Demoulin, P. Hoffmann, M. Cauterman
2004, pp.95. ⟨hal-00142335⟩
Using low frequency noise characterization of AlGaN/GaN HEMT as a tool for technology assessment and failure prediction
Jean-Guy Tartarin, Geoffroy Soubercaze-Pun, Abdelali Rennane, Laurent Bary, Jean-Claude de Jaeger, Marie Germain, S. Delage, Robert Plana, Jacques Graffeuil
Using low frequency noise characterization of AlGaN/GaN HEMT as a tool for technology assessment and failure prediction . 2004, pp.296-306. ⟨hal-00141968⟩
Application of the FEM and the BEM to compute the field of a transducer mounted in a rigid baffle (3D case)
Jamal Assaad, Anne-Christine Hladky, B. Cugnet
Ultrasonics, 2004, 42, pp.443-446. ⟨hal-00141977⟩
Signal processing for damage detection using two different array transducers
Faysal El Youbi, Sébastien Grondel, Jamal Assaad
Ultrasonics, 2004, 42, pp.803-806. ⟨10.1016/j.ultras.2004.01.070⟩. ⟨hal-00142003⟩
Study by ultrasound of the impact of technological parameters changes in the milk gelation process
Georges Nassar, Bertrand Nongaillard, Y. Noel
Journal of Food Engineering, 2004, 63, pp.229-236. ⟨hal-00142002⟩
Experimental analysis of a multi-conductor uniform line above soil for modelling a railway line
A. Cozza, F. Canavero, B. Demoulin, J.M. Bodson, V. Sabate, J.M. Vanzemberg
2004, pp.465-468. ⟨hal-00142009⟩
Use of crosstalk coupling to test the susceptibility of electronic components in wide frequency range
S. Bazzoli, B. Demoulin, M. Cauterman, P. Hoffmann
2004, pp.47-51. ⟨hal-00142021⟩
Propagation of Lamb waves on rough plates : analysis of the beam section
D. Leduc, Catherine Potel, B. Morvan, C. Depollier, P. Pareige, Anne-Christine Hladky, J.L. Izbicki
2004, pp.164-171. ⟨hal-00142042⟩
Reliability investigation of gallium nitride HEMT microelectronics reliability
A. Sozza, C. Dua, E. Morvan, B. Grimbert, Virginie Hoel, S.L. Delage, N. Chaturvedi, R. Lossy, J. Wuerfl
Microelectronics Reliability, 2004, 44, pp.1369-1373. ⟨hal-00141958⟩