Publicaciones

Affichage de 13741 à 13750 sur 16058


  • COMM

Mode stirred chambers for simulating MIMO channels

M. Lienard, Pierre Laly, Pierre Degauque

Proceedings of the COST 273 Meeting, 2004, Athenes, Greece. ⟨hal-00142317⟩

  • COMM

Electromagnetic susceptibility of IC's due to HPM coupling

S. Bazzoli, B. Demoulin, P. Hoffmann, M. Cauterman

2004, pp.95. ⟨hal-00142335⟩

  • COMM

Using low frequency noise characterization of AlGaN/GaN HEMT as a tool for technology assessment and failure prediction

Jean-Guy Tartarin, Geoffroy Soubercaze-Pun, Abdelali Rennane, Laurent Bary, Jean-Claude de Jaeger, Marie Germain, S. Delage, Robert Plana, Jacques Graffeuil

Using low frequency noise characterization of AlGaN/GaN HEMT as a tool for technology assessment and failure prediction . 2004, pp.296-306. ⟨hal-00141968⟩

  • ART

Application of the FEM and the BEM to compute the field of a transducer mounted in a rigid baffle (3D case)

Jamal Assaad, Anne-Christine Hladky, B. Cugnet

Ultrasonics, 2004, 42, pp.443-446. ⟨hal-00141977⟩

  • ART

Study by ultrasound of the impact of technological parameters changes in the milk gelation process

Georges Nassar, Bertrand Nongaillard, Y. Noel

Journal of Food Engineering, 2004, 63, pp.229-236. ⟨hal-00142002⟩

  • COMM

Experimental analysis of a multi-conductor uniform line above soil for modelling a railway line

A. Cozza, F. Canavero, B. Demoulin, J.M. Bodson, V. Sabate, J.M. Vanzemberg

2004, pp.465-468. ⟨hal-00142009⟩

  • COMM

Use of crosstalk coupling to test the susceptibility of electronic components in wide frequency range

S. Bazzoli, B. Demoulin, M. Cauterman, P. Hoffmann

2004, pp.47-51. ⟨hal-00142021⟩

  • COMM

Propagation of Lamb waves on rough plates : analysis of the beam section

D. Leduc, Catherine Potel, B. Morvan, C. Depollier, P. Pareige, Anne-Christine Hladky, J.L. Izbicki

2004, pp.164-171. ⟨hal-00142042⟩

  • ART

Reliability investigation of gallium nitride HEMT microelectronics reliability

A. Sozza, C. Dua, E. Morvan, B. Grimbert, Virginie Hoel, S.L. Delage, N. Chaturvedi, R. Lossy, J. Wuerfl

Microelectronics Reliability, 2004, 44, pp.1369-1373. ⟨hal-00141958⟩