Publicaciones
Affichage de 13771 à 13780 sur 16104
Depth dependence of defect evolution and TED during annealing
B. Colombeau, N.E.B. Cowern, Fuccio Cristiano, P. Calvo, Y. Lamrani, Nikolay Cherkashin, E. Lampin, Alain Claverie
Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, 2004, 216, pp.90-94. ⟨hal-00140976⟩
Application de la sismique réflexion pour la reconnaissance du sous-sol aux faibles profondeurs
Bogdan Piwakowski, T. Windal, C. Gomez
Actes des Journées Nationales de Géotechnique et de Géologie de l'Ingénieur, JNGGI 2004, 2004, Lille, France. ⟨hal-00247817⟩
Study by ultrasound of the impact of technological parameters changes in the milk gelation process
Georges Nassar, Bertrand Nongaillard, Y. Noel
Journal of Food Engineering, 2004, 63, pp.229-236. ⟨hal-00142002⟩
Preparation and characterization of conductive polymer/PP composites
B. Kim, V. Konvar, E. Devaux, C. Dufour
Polymer Fibres 2004, 2004, Manchester, United Kingdom. ⟨hal-00140755⟩
Jonctions silicium-molecules-metal par « nanotransfert printing » : synthèse chimique et propriétés électriques
C. Merckling, David Guérin, S. Lenfant, D. Vuillaume
Journées Nationales du GDR Nanoélectronique, 2004, Aussois, France. ⟨hal-00140746⟩
Transport electronique dans les nanostructures organiques
D. Vuillaume
1ère Rencontre Grenobloise d'Electronique Moléculaire, 2004, Grenoble, France. ⟨hal-00140774⟩
Charge transport in DNA
T. Heim, Thierry Melin, D. Deresmes, D. Vuillaume
5th International Symposium on MEMS and Nanotechnology, 2004, Costa Mesa, CA, United States. ⟨hal-00140750⟩
Silicon-molecules-metal junctions by nanotransfer printing
C. Merckling, David Guérin, S. Lenfant, D. Vuillaume
European Conference on Organized Films, ECOF 2004, 2004, Valladolid, Spain. ⟨hal-00140759⟩
Using low frequency noise characterization of AlGaN/GaN HEMT as a tool for technology assessment and failure prediction
Jean-Guy Tartarin, Geoffroy Soubercaze-Pun, Abdelali Rennane, Laurent Bary, Jean-Claude de Jaeger, Marie Germain, S. Delage, Robert Plana, Jacques Graffeuil
Using low frequency noise characterization of AlGaN/GaN HEMT as a tool for technology assessment and failure prediction . 2004, pp.296-306. ⟨hal-00141968⟩
Reliability investigation of gallium nitride HEMT microelectronics reliability
A. Sozza, C. Dua, E. Morvan, B. Grimbert, Virginie Hoel, S.L. Delage, N. Chaturvedi, R. Lossy, J. Wuerfl
Microelectronics Reliability, 2004, 44, pp.1369-1373. ⟨hal-00141958⟩