Publicaciones
Affichage de 13791 à 13800 sur 16175
High microwave and noise performance of 0.17µm AlGaN/GaN HEMTs on high-resistivity silicon substrates
A. Minko, Virginie Hoel, Sylvie Lepilliet, Gilles Dambrine, Jean-Claude de Jaeger, Y. Cordier, F. Semond, F. Natali, J. Massies
IEEE Electron Device Letters, 2004, 25, pp.167-169. ⟨hal-00141951⟩
Detection of gold colloid adsorption at a solid/liquid interface using micromachined piezoelectric resonators
M. Guirardel, Liviu Nicu, Daisuke Saya, Y. Tauran, Eric Cattan, Denis Remiens, C. Bergaud
Japanese Journal of Applied Physics, part 2 : Letters, 2004, 43, pp.L111-L114. ⟨hal-00141179⟩
L'électronique moléculaire
J.P. Bourgoin, M. Goffman, A. Filoramo, D. Vuillaume
LAHMANI M., DUPAS C., HOUDY P. Les nanosciences 1 - Nanotechnologies et nanophysique, Belin, Paris, France, pp.400-449, 2004. ⟨hal-00131398⟩
Caractérisation de films d'alcènes greffés sur des surfaces Si(111) par analyse XPS résolue angulairement
X. Wallart, C. Henry de Villeneuve, P. Allongue
2004, pp.152-157. ⟨hal-00140723⟩
Two-photon absorption in InP substrates in the 1.55 µm range
D. Vignaud, Jean-Francois Lampin, F. Mollot
2004, pp.134-137. ⟨hal-00140715⟩
Evolution of the density of states from a two- to a zero-dimensional semiconductor
Zeger Hens, B. Grandidier, D. Deresmes, Guy Allan, Christophe Delerue, Didier Stiévenard, Daniel Vanmaekelbergh
EPL - Europhysics Letters, 2004, 65, pp.809-815. ⟨10.1209/epl/i2003-10130-3⟩. ⟨hal-00141246⟩
A micro-nib nanoelectrospray source for mass spectrometry
S. Arscott, S. Le Gac, C. Druon, P. Tabourier, C. Rolando
Sensors and Actuators B: Chemical, 2004, 98 (2-3), pp.140-147. ⟨hal-00140771⟩
Silicon-molecules-metal junctions by nanotransfer printing
C. Merckling, David Guérin, S. Lenfant, D. Vuillaume
French-Japan Workshop on Nanomaterials, 2004, Bordeaux, France. ⟨hal-00140758⟩
Plateforme SAW dédiée à la microfluidique discrète pour applications biologiques
A. Renaudin, P. Tabourier, V. Zhang, C. Druon
Actes du 2ème Congrès Français de Microfluidique, 2004, Toulouse, France. ⟨hal-00142067⟩
Depth dependence of defect evolution and TED during annealing
B. Colombeau, N.E.B. Cowern, Fuccio Cristiano, P. Calvo, Y. Lamrani, Nikolay Cherkashin, E. Lampin, Alain Claverie
Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, 2004, 216, pp.90-94. ⟨hal-00140976⟩