Publicaciones
Affichage de 13871 à 13880 sur 16075
A planar on-chip micro-nib interface for NanoESI-MS microfluidic applications
S. Arscott, S. Le Gac, C. Druon, P. Tabourier, C. Rolando
Journal of Micromechanics and Microengineering, 2004, 14, pp.310-316. ⟨hal-00140772⟩
Effect of quantum confinement on the dielectric constant of PbSe
Zeger Hens, Daniel Vanmaekelbergh, Ernst Stefan Kooij, Herbert Wormeester, Guy Allan, Christophe Delerue
Physical Review Letters, 2004, 92, pp.026808/1-4. ⟨10.1103/PhysRevLett.92.026808⟩. ⟨hal-00141244⟩
Electric force microscopy of individually charged semiconductor nanoparticles on conductive substrates : an analytical model for quantitative charge imaging
Thierry Melin, H. Diesinger, D. Deresmes, D. Stievenard
Physical Review B: Condensed Matter and Materials Physics (1998-2015), 2004, 69, pp.035321/1-8. ⟨hal-00141248⟩
Unusual quantum confinement in IV-VI materials
Guy Allan, Christophe Delerue
European Materials Research Society Spring Meeting, May 2004, Strasbourg, France. ⟨10.1016/j.msec.2005.06.026⟩. ⟨hal-00141286⟩
Recent french results in molecular-scale electronics
D. Vuillaume
French-Russian Conference on Nanosciences and Nanotechnology, 2004, Moscou, Russia. ⟨hal-00140756⟩
Electrical and morphological properties of PP and PET conductive polymer fibers
B. Kim, V. Koncar, E. Devaux, C. Dufour, P. Viallier
Synthetic Metals, 2004, 146, pp.167-174. ⟨hal-00140736⟩
Integration of molecules on a chip : from Si-H surface chemistry to nanometer-sized diodes
L. Baraton, J.P. Bourgoin, Vincent Derycke, Erik Dujardin, C. Chevrot, Serge Palacin, D. Vuillaume
Ultimate Lithography and Nanodevice Engineering, 2004, Agelonde, France. ⟨hal-00140741⟩
Technique de déconvolution aveugle appliquée au contrôle non destructif par micro-ondes
D. Glay, T. Lasri
PLACKO D., ORTEU J.J., LEPOUTRE F. Instrumentation - Aspects fondamentaux, Hermès, pp.189-196, 2004. ⟨hal-00132298⟩
Influence of a tunneling gate current on the noise performance of SOI MOSFETs
G. Pailloncy, B. Iniguez, Gilles Dambrine, Francois Danneville
2004, pp.55-57. ⟨hal-00133883⟩
Thermal de-embedding procedure for cryogenic on-wafer high frequency noise measurement
S. Delcourt, Gilles Dambrine, Nour Eddine Bourzgui, Francois Danneville, C. Laporte, J.P. Fraysse, M. Maignan
2004, pp.414-421. ⟨hal-00133897⟩