Publicaciones

Affichage de 13871 à 13880 sur 16059


  • COMM

Low frequency noise and transport mechanisms in AlGaN/GaN HEMT devices

Jean-Guy Tartarin, Geoffroy Soubercaze-Pun, Abdelali Rennane, Laurent Bary, Robert Plana, Jean-Claude de Jaeger, Marie Germain, S. Delage, Jacques Graffeuil

European Microwave Week, 2004, Amsterdam, Netherlands. ⟨hal-00141963⟩

  • COMM

Amélioration des performances des HEMTs AlGaN/GaN sur substrat Si

A. Minko, Virginie Hoel, Christophe Gaquière, D. Theron, Jean-Claude de Jaeger, Y. Cordier, F. Semond, F. Natali, J. Massies, H. Lareche, L. Wedzikowski, R. Langer, P. Bove

GDR Grand Gap, 2004, Fréjus, France. ⟨hal-00141966⟩

  • ART

AlGaN/GaN HEMTs on Si with power density performance of 1.9 W/mm at 10 GHz

A. Minko, Virginie Hoel, E. Morvan, B. Grimbert, A. Soltani, E. Delos, D. Ducatteau, Christophe Gaquière, D. Theron, Jean-Claude de Jaeger, H. Lahreche, L. Wedzikowski, R. Langer, P. Bove

IEEE Electron Device Letters, 2004, 25, pp.453-455. ⟨hal-00141952⟩

  • COMM

Advanced and nanometric MOSFET architecture, multiple gate devices and Pi gates

J. Penaud, F. Fruleux, Emmanuel Dubois, G. Larrieu

MIGAS International Summer School on Advanced Microelectronics, MIGAS'04, 2004, Autrans, France. ⟨hal-00140995⟩

  • COMM

Ferroelectric properties of PbZr0.40Ti0.60O3/LaxSr1-xCoO3 heterostructures prepared by chemical solution routes

G.S. Wang, X.J. Meng, J.L. Sun, J.H. Chu, Denis Remiens

2004, pp.277-288. ⟨hal-00162778⟩

  • COMM

Novel 2D micronib ionization sources for nano electrospray-mass spectrometry (ESI-MS)

S. Le Gac, C. Rolando, S. Arscott

Thermal and Mechanical Simulation and Experiments in Microelectronics and Microsystems - EuroSimE 2004, May 2004, Brussels, Belgium. pp.305-309, ⟨10.1109/ESIME.2004.1304055⟩. ⟨hal-02347786⟩

  • ART

Two Young modulus of Pb(Zr,Ti)03 thin films measured by nanoindentation

Patrick Delobelle, Olivier Guillon, E. Fribourg-Blanc, Caroline Soyer, Eric Cattan, Denis Remiens

Applied Physics Letters, 2004, 85(22), pp. 1-3. ⟨hal-00019767⟩

  • COMM

Sur la signification des valeurs du module d'Young déterminé par nanoindentation dans le cas des matériaux ferroélectriques

Patrick Delobelle, Olivier Guillon, E. Fribourg-Blanc, Caroline Soyer, Denis Remiens

2004. ⟨hal-00020033⟩