Publicaciones

• Communication dans un congrès

High resolution seismic imaging as an efficient tool for shallow subsurface survey : case studies

Bogdan Piwakowski

1st General Assembly of the European Geosciences Union, 2004, France. pp.EGU04-A-03836. ⟨hal-00247804⟩

• Article dans une revue

Conductivity of DNA probed by conducting-atomic force microscopy : effects of contact electrode, DNA stucture and surface interactions

T. Heim, D. Deresmes, Dominique Vuillaume

Journal of Applied Physics, 2004, 96, pp.2927-2936. ⟨10.1063/1.1769606⟩. ⟨hal-00140730⟩

• Article dans une revue

Aluminum, oxide and silicon phonons by IETS on MOS tunnel junctions : accurate determination and effect of electrical stress

C. Petit, G. Salace, D. Vuillaume

Journal of Applied Physics, 2004, 96, pp.5042-5049. ⟨hal-00140733⟩

• Communication dans un congrès

Noise modeling and performance in 0.15 µm fully depleted SOI MOSFET

G. Pailloncy, B. Iniguez, Gilles Dambrine, M. Dehan, J.P. Raskin, H. Matsuhashi, P. Delatte, Francois Danneville

2004, pp.122-130. ⟨hal-00133895⟩

• Communication dans un congrès

Reconstruction of bubble translation in travelling ultrasonic waves

P. Koch, R. Mettin, T. Tervo, W. Lauterborn, Bertrand Dubus, A. Moussatov

9th Meeting of the European Society of Sonochemistry, 2004, Badajoz, Spain. ⟨hal-00133873⟩

• Communication dans un congrès

Cavitation bubble structures in low and high intensity ultrasonic fields

A. Moussatov, C. Granger, Bertrand Dubus, R. Mettin, T. Tervo, W. Lauterborn

Anglo-French Physical Acoustics Conference, 2004, Wye, United Kingdom. ⟨hal-00133856⟩

• Article dans une revue

Nonlinear effects in T-branch junctions

J. Mateos, B.G. Vasallo, D. Pardo, T. Gonzales, E. Pichonat, J.S. Galloo, S. Bollaert, Yannick Roelens, A. Cappy

IEEE Electron Device Letters, 2004, 25, pp.235-237. ⟨hal-00133878⟩

• Communication dans un congrès

Autoregressive multiple access interference model and fats asynchronous DS-CDMA simulator

R. Okouyi, Laurent Clavier, W. Sawaya, Y. Delignon

2004, pp.173-176. ⟨hal-00142285⟩

• Article dans une revue

One-dimensional reconstruction of a defect profile based on millimeter-wave nondestructive techniques

M. Maazi, D. Glay, T. Lasri

Microwave and Optical Technology Letters, 2004, 43, pp.133-138. ⟨hal-00133929⟩

• Article dans une revue

Low-loss InGaAsP/InP submicron optical waveguides fabricated by ICP etching

Samuel Dupont, Arnaud Beaurain, Patrice Miska, Malek Zegaoui, Jean-Pierre Vilcot, Hongwu Li, M. Constant, Didier Decoster, Jean Chazelas

The fabrication and characterisation of low-loss InGaAsP/InP optical submicron waveguides made with ICP etching is reported. Their width ranges from 0.2 to 2 μm. For the 0.5 μm width, the propagation losses at λ=1.55 μm as low as 4.2 dB/mm have been measured.

Electronics Letters, 2004, 40, pp.865-866. ⟨hal-00141187⟩