Publicaciones
Affichage de 13881 à 13890 sur 16104
Radiometric sensor for temperature control of food processing
V. Thomy, Luc Dubois, C. Vanoverschelde, J.P. Sozanski, J. Pribetich
IEEE Sensors Journal, 2004, 4, pp.772-778. ⟨hal-00133930⟩
Ambipolar charge injection and transport in a single pentacene monolayer island
T. Heim, K. Lmimouni, D. Vuillaume
Nano Letters, 2004, 4, pp.2145-2150. ⟨hal-00140734⟩
Nano-powder ceramics synthesis by laser pyrolysis : numerical investigation
Mohamed Amara, M. El Ganaoui, D. Hourlier
First Symposium NITECH-CEC, 2004, Limoges, France. ⟨hal-00248024⟩
Polysilsesquioxane derived ceramic foams with a gradient porosity
J. Zeschky, T. Höfner, C. Arnold, D. Bahloul-Hourlier, P. Greil
28th International Conference on Advanced Ceramics and Composites, 2004, Cocoa Beach, FL, United States. ⟨hal-00248021⟩
Conception de filtres en technologie 2.5 D en bande millimétrique
Gaëtan Prigent, Eric Rius, Henri Happy, Karine Blary, Sylvie Lepilliet
Workshop du Réseau des Grandes Centrales Technologiques pour la Recherche Technologique de Base (RTB), 2004, Paris, France. ⟨hal-00247952⟩
Nonlinear noise modeling in FETs for the design of low noise active mixers
Francois Danneville
IEEE MTT-S International Microwave Symposium, Workshop on System-Level Measurement, Modelling, and Design Issues of Mixers, 2004, Fort Worth, TX, United States. ⟨hal-00133911⟩
Technique de déconvolution aveugle appliquée au contrôle non destructif par micro-ondes
D. Glay, T. Lasri
PLACKO D., ORTEU J.J., LEPOUTRE F. Instrumentation - Aspects fondamentaux, Hermès, pp.189-196, 2004. ⟨hal-00132298⟩
Design optimization of AlInAs-GaInAs HEMTs for high frequency applications
J. Mateos, T. Gonzales, D. Pardo, S. Bollaert, T. Parenty, A. Cappy
IEEE Transactions on Electron Devices, 2004, 51, pp.521-528. ⟨hal-00133866⟩
Influence of a tunneling gate current on the noise performance of SOI MOSFETs
G. Pailloncy, B. Iniguez, Gilles Dambrine, Francois Danneville
2004, pp.55-57. ⟨hal-00133883⟩
Thermal de-embedding procedure for cryogenic on-wafer high frequency noise measurement
S. Delcourt, Gilles Dambrine, Nour Eddine Bourzgui, Francois Danneville, C. Laporte, J.P. Fraysse, M. Maignan
2004, pp.414-421. ⟨hal-00133897⟩