Publicaciones
Affichage de 14051 à 14060 sur 16104
Résonateurs de Perot-Fabry accordables en fréquence par cristal liquide
Ronan Sauleau, Nicolas Tentillier, Bertrand Splingart, Coquet Philippe
Treizièmes Journées Nationales Micro-ondes (JNM 2003), May 2003, Lille, France. 4 p. ⟨hal-00553231⟩
Near-Field Coupling Between a Printed Antenna and a Fabry-Perot Resonator : Experimental Study of the Radiation Properties at Millimeter Wave Frequencies
Ronan Sauleau, Philippe Coquet, T. Matsui
Microwave and Optical Technology Letters, 2003, 38 (6), pp.438-443. ⟨hal-00553217⟩
Assessment of deteriorated concrete cover by high frequency ultrasonic waves
A. Fnine, M. Goueygou, F. Buyle-Bodin, Bogdan Piwakowski
6th International Symposium on Non-Destructive Testing in Civil Engineering, NDT-CE 2003, 2003, Germany. pp.463-469. ⟨hal-00250185⟩
Sommation optique de signaux hyperfréquences
N. Breuil, C. Fourdin, P. Nicole, G. Ulliac, Jean-Pierre Vilcot, J. Chazelas
2003, pp.6C-6. ⟨hal-00146559⟩
Relationship between porosity, permeability and ultrasonic parameters in sound and damaged mortar
M. Goueygou, Z. Lafhaj, M. Kaczmarek
International Symposium on Non Destructive Testing in Civil Engineering, NDT-CE 2003, 2003, Germany. pp.1-9. ⟨hal-00250178⟩
M-line spectroscopy for optical analysis of thick LiNbO3 layers grown on sapphire substrates by radio-frequency multistep sputtering
El Hadj Dogheche, X. Lansiaux, Denis Remiens
Journal of Applied Physics, 2003, 93 (2), pp.1165-1168. ⟨10.1063/1.1530367⟩. ⟨hal-00146473⟩
Mechanical analysis of interconnect structures using process simulation
V. Senez, T. Hoffmann, P. Le Duc, F. Murray
Journal of Applied Physics, 2003, 93, pp.6039-6049. ⟨hal-00146398⟩
Metamorphic InAIAs/InGaAs HEMTs : material properties and device performance
Y. Cordier, S. Bollaert, M. Zaknoune, J.M. Chauveau, A. Cappy
CAI W.Z. III-V semiconductor heterostructures : physics and devices, Research Signpost, Kerala, India, pp.111-138, 2003. ⟨hal-00132383⟩
Numerical analysis of the process induced stresses in silicon microstructures
V. Senez, T. Hoffmann, A. Armigliato, I. de Wolf
2003, pp.350-361. ⟨hal-00146444⟩
Low frequency drain noise comparison of AlGaN/GaN HEMTs grown on silicon, SiC and sapphire substrates
A. Curutchet, N. Malbert, N. Touboul, Christophe Gaquière, A. Minko, M. Uren
Microelectronics Reliability, 2003, 43, pp.1713-1718. ⟨hal-00146665⟩