Publicaciones
Affichage de 14091 à 14100 sur 16255
Transmission electron microscopy of silicides used in ALSB-SOI MOSFET structure
J. Katcki, J. Ratajczak, A. Laszcz, Emmanuel Dubois, G. Larrieu, X. Baie
2004, pp.479-482. ⟨hal-00147750⟩
Ferroelectric properties of PbZr0.40Ti0.60O3/LaxSr1-xCoO3 heterostructures prepared by chemical solution routes
G.S. Wang, X.J. Meng, J.L. Sun, J.H. Chu, Denis Remiens
2004, pp.277-288. ⟨hal-00162778⟩
Nouveaux algorithmes pour la modélisation physique macroscopique, électrique et électromagnétique des circuits microondes à l'état solide
A. El Moussati
2004. ⟨hal-00162761⟩
Non-linear modeling of the kink effect in deep sub-micron SOI MOSFET
A. Siligaris, Gilles Dambrine, Francois Danneville
2004, pp.47-50. ⟨hal-00133900⟩
Angle of arrival measurement using ultra fast transient analyzer and music algorithm
A. Benlarbi-Delai, N. Rolland-Haese, A. Ghis, P.A. Rolland
Microwave and Optical Technology Letters, 2004, 41, pp.141-144. ⟨hal-00133924⟩
Novel 2D micronib ionization sources for nano electrospray-mass spectrometry (ESI-MS)
S. Le Gac, C. Rolando, S. Arscott
Thermal and Mechanical Simulation and Experiments in Microelectronics and Microsystems - EuroSimE 2004, May 2004, Brussels, Belgium. pp.305-309, ⟨10.1109/ESIME.2004.1304055⟩. ⟨hal-02347786⟩
Two Young modulus of Pb(Zr,Ti)03 thin films measured by nanoindentation
Patrick Delobelle, Olivier Guillon, E. Fribourg-Blanc, Caroline Soyer, Eric Cattan, Denis Remiens
Applied Physics Letters, 2004, 85(22), pp. 1-3. ⟨hal-00019767⟩
Sur la signification des valeurs du module d'Young déterminé par nanoindentation dans le cas des matériaux ferroélectriques
Patrick Delobelle, Olivier Guillon, E. Fribourg-Blanc, Caroline Soyer, Denis Remiens
2004. ⟨hal-00020033⟩