Publicaciones

Affichage de 14121 à 14130 sur 16058


  • COMM

Controlled charge injection in semiconductor nanoparticles

H. Diesinger, Thierry Melin, D. Deresmes, D. Stiévenard

12th International Conference on Scanning Tunneling Microscopy, Spectroscopy and Related Techniques, STM'03, 2003, Eindhoven, Netherlands. ⟨hal-00146616⟩

  • COMM

Electron-beam-induced reactivation of Si dopants in hydrogenated 2D AlGaAs heterostructures : a possible new route of fabricating III-V nanostructures

L. Kurowski, D. Bernard-Loridant, E. Constant, Didier Decoster

7th International Workshop on Beam Injection Assessment of Microstructures in Semiconductors, 2003, Lille, France. ⟨hal-00146558⟩

  • COMM

Nanotechnologie et détection électrique d'interaction bio-moléculaire

D. Stievenard

Club Microcapteurs Chimiques (CMC2), Colloque XXIX : Capteurs et Nanotechnologies, 2003, Paris, France. ⟨hal-00146646⟩

  • COMM

Electrical characterization of PMNT thin films

E. Fribourg-Blanc, E. Defaÿ, Eric Cattan, Denis Remiens, G. Tartavel, M. Aïd

2003, pp.853-862. ⟨hal-00146474⟩

  • COMM

Arabic isolated word recognition using general regression neural network

A. Amrouche, Jean-Michel Rouvaen

2003, pp.689-692. ⟨hal-00154885⟩

  • OTHER

Imagerie et détection ultrasonores par corrélation

B. El Khaldi

2003. ⟨hal-00162743⟩

  • ART

Wave-mechanical calculations of leakage current through stacked dielectrics for nanotransistor Metal-Oxide-Semiconductor design

M. Le Roy, Eric Lheurette, O. Vanbésien, D. Lippens

Journal of Applied Physics, 2003, 93, pp.2966-2971. ⟨hal-00146086⟩

  • COMM

Raman characterization of Mg+ ion-implanted GaN

B. Boudart, Yannick Guhel, J. C. Pesant, Paul Dhamelincourt, M.A. Poisson

7th International Workshop on Beam Injection Assessment of Microstructures in Semiconductors, 2003, Lille, France. ⟨hal-01649531⟩