Publicaciones
Affichage de 14121 à 14130 sur 16058
Controlled charge injection in semiconductor nanoparticles
H. Diesinger, Thierry Melin, D. Deresmes, D. Stiévenard
12th International Conference on Scanning Tunneling Microscopy, Spectroscopy and Related Techniques, STM'03, 2003, Eindhoven, Netherlands. ⟨hal-00146616⟩
Electron-beam-induced reactivation of Si dopants in hydrogenated 2D AlGaAs heterostructures : a possible new route of fabricating III-V nanostructures
L. Kurowski, D. Bernard-Loridant, E. Constant, Didier Decoster
7th International Workshop on Beam Injection Assessment of Microstructures in Semiconductors, 2003, Lille, France. ⟨hal-00146558⟩
Nanotechnologie et détection électrique d'interaction bio-moléculaire
D. Stievenard
Club Microcapteurs Chimiques (CMC2), Colloque XXIX : Capteurs et Nanotechnologies, 2003, Paris, France. ⟨hal-00146646⟩
Electrical characterization of PMNT thin films
E. Fribourg-Blanc, E. Defaÿ, Eric Cattan, Denis Remiens, G. Tartavel, M. Aïd
2003, pp.853-862. ⟨hal-00146474⟩
Hydrothermal synthesis of PbTiO3 ferroelectric films : characterizations with large frequency and temperature ranges and sensor application
Didier Fasquelle, Jean-Claude Carru, S. Euphrasie, Philippe Pernod, S. Daviero-Minaud
Ferroelectrics, 2003, 288 (1), pp.39-48. ⟨10.1080/00150190390212070⟩. ⟨hal-00146117⟩
Arabic isolated word recognition using general regression neural network
A. Amrouche, Jean-Michel Rouvaen
2003, pp.689-692. ⟨hal-00154885⟩
Wave-mechanical calculations of leakage current through stacked dielectrics for nanotransistor Metal-Oxide-Semiconductor design
M. Le Roy, Eric Lheurette, O. Vanbésien, D. Lippens
Journal of Applied Physics, 2003, 93, pp.2966-2971. ⟨hal-00146086⟩
Formation of Pt-based silicide contacts : kinetics, stochiometry and current drive capabilities
Guilhem Larrieu, Emmanuel Dubois, X. Wallart, Xavier Baie, J. Katcki
Journal of Applied Physics, 2003, 94 (12), pp.7801-7810. ⟨10.1063/1.1605817⟩. ⟨hal-00146394⟩
Raman characterization of Mg+ ion-implanted GaN
B. Boudart, Yannick Guhel, J. C. Pesant, Paul Dhamelincourt, M.A. Poisson
7th International Workshop on Beam Injection Assessment of Microstructures in Semiconductors, 2003, Lille, France. ⟨hal-01649531⟩