Publicaciones
Affichage de 14141 à 14150 sur 16062
Numerical analysis of the process induced stresses in silicon microstructures
V. Senez, T. Hoffmann, A. Armigliato, I. de Wolf
2003, pp.350-361. ⟨hal-00146444⟩
About the measurements of the d33 piezoelectric coefficient of the PZT film-Si/SiO2/Ti/Pt substrates using an optical cryostat
J. Nosek, L. Burianova, M. Sulc, Caroline Soyer, Eric Cattan, Denis Remiens
Ferroelectrics, 2003, 292, pp.103-109. ⟨hal-00146464⟩
Sommation optique de signaux hyperfréquences
N. Breuil, C. Fourdin, P. Nicole, G. Ulliac, Jean-Pierre Vilcot, J. Chazelas
2003, pp.6C-6. ⟨hal-00146559⟩
Modélisation d'interconnexions submicroniques VLSI en présences des milieux environnants à pertes
K. El Bouazzati, Jean-François Legier, Erick Paleczny, Christophe Seguinot, Denis Deschacht
IES, 2003, Villeneuve d'Ascq, France. pp.2D-17. ⟨hal-00146561⟩
Concept of dielectric constant for nanosized systems
Christophe Delerue, Guy Allan, Michel Lannoo
Physical Review B: Condensed Matter and Materials Physics (1998-2015), 2003, 68, pp.115411-1-4. ⟨10.1103/PhysRevB.68.115411⟩. ⟨hal-00146590⟩
Optical transitions in few-electron artificial atoms strongly confined in ZnO nanocrystals
Alexander Germeau, Aarnoud L. Roest, Daniel Vanmaekelbergh, Guy Allan, Christophe Delerue, Eric A. Meulenkamp
Physical Review Letters, 2003, 90, pp.097401/1-4. ⟨10.1103/PhysRevLett.90.097401⟩. ⟨hal-00146610⟩
The effect of quantum confinement on the optical properties of semiconductor nanocrystals
Christophe Delerue, Guy Allan
Materials Research Society Fall Meeting, 2003, Boston, MA, United States. ⟨hal-00146644⟩
Charge transport in self-assembled molecular rectifying diodes on silicon
Christophe Delerue, Guy Allan, Stéphane Lenfant, Dominique Vuillaume, Christophe Krzeminski
Workshop France-USA on Molecular-Scale Electronics, 2003, Paris, France. ⟨hal-00146645⟩
60-GHz high power performance In0.32 Al0.68 As-In0.33 Ga 0.67 As metamorphic HEMTs on GaAs
M. Zaknoune, M. Ardouin, Y. Cordier, S. Bollaert, B. Bonte, Didier Theron
IEEE Electron Device Letters, 2003, 24, pp.724-726. ⟨hal-00146648⟩
Low frequency drain noise comparison of AlGaN/GaN HEMTs grown on silicon, SiC and sapphire substrates
A. Curutchet, N. Malbert, N. Touboul, Christophe Gaquière, A. Minko, M. Uren
Microelectronics Reliability, 2003, 43, pp.1713-1718. ⟨hal-00146665⟩