Publicaciones

Affichage de 14141 à 14150 sur 16062


  • COMM

Numerical analysis of the process induced stresses in silicon microstructures

V. Senez, T. Hoffmann, A. Armigliato, I. de Wolf

2003, pp.350-361. ⟨hal-00146444⟩

  • ART

About the measurements of the d33 piezoelectric coefficient of the PZT film-Si/SiO2/Ti/Pt substrates using an optical cryostat

J. Nosek, L. Burianova, M. Sulc, Caroline Soyer, Eric Cattan, Denis Remiens

Ferroelectrics, 2003, 292, pp.103-109. ⟨hal-00146464⟩

  • COMM

Sommation optique de signaux hyperfréquences

N. Breuil, C. Fourdin, P. Nicole, G. Ulliac, Jean-Pierre Vilcot, J. Chazelas

2003, pp.6C-6. ⟨hal-00146559⟩

  • COMM

Modélisation d'interconnexions submicroniques VLSI en présences des milieux environnants à pertes

K. El Bouazzati, Jean-François Legier, Erick Paleczny, Christophe Seguinot, Denis Deschacht

IES, 2003, Villeneuve d'Ascq, France. pp.2D-17. ⟨hal-00146561⟩

  • COMM

The effect of quantum confinement on the optical properties of semiconductor nanocrystals

Christophe Delerue, Guy Allan

Materials Research Society Fall Meeting, 2003, Boston, MA, United States. ⟨hal-00146644⟩

  • COMM

Charge transport in self-assembled molecular rectifying diodes on silicon

Christophe Delerue, Guy Allan, Stéphane Lenfant, Dominique Vuillaume, Christophe Krzeminski

Workshop France-USA on Molecular-Scale Electronics, 2003, Paris, France. ⟨hal-00146645⟩

  • ART

60-GHz high power performance In0.32 Al0.68 As-In0.33 Ga 0.67 As metamorphic HEMTs on GaAs

M. Zaknoune, M. Ardouin, Y. Cordier, S. Bollaert, B. Bonte, Didier Theron

IEEE Electron Device Letters, 2003, 24, pp.724-726. ⟨hal-00146648⟩

  • ART

Low frequency drain noise comparison of AlGaN/GaN HEMTs grown on silicon, SiC and sapphire substrates

A. Curutchet, N. Malbert, N. Touboul, Christophe Gaquière, A. Minko, M. Uren

Microelectronics Reliability, 2003, 43, pp.1713-1718. ⟨hal-00146665⟩