Publicaciones
Affichage de 14241 à 14250 sur 16273
The effect of quantum confinement on the optical properties of semiconductor nanocrystals
Christophe Delerue, Guy Allan
Materials Research Society Fall Meeting, 2003, Boston, MA, United States. ⟨hal-00146644⟩
HEMT métamorphique pour applications de puissance en bande V : influence de la couche de barrière
B. Bonte, M. Ardouin, M. Zaknoune, D. Theron, Y. Cordier, S. Bollaert, Jean-Claude de Jaeger
2003, pp.4A2-2. ⟨hal-00146696⟩
Optimisation des performances du transistor HEMT AlGaN/GaN sur substrat Si
A. Minko, Virginie Hoel, D. Theron, Jean-Claude de Jaeger, Y. Cordier, F. Semond, F. Natali, J. Massies
GDR Grand Gap, 2003, Nice, France. ⟨hal-00146717⟩
Sommation optique de signaux hyperfréquences
N. Breuil, C. Fourdin, P. Nicole, G. Ulliac, Jean-Pierre Vilcot, J. Chazelas
2003, pp.6C-6. ⟨hal-00146559⟩
Charge transport in self-assembled molecular rectifying diodes on silicon
Christophe Delerue, Guy Allan, Stéphane Lenfant, Dominique Vuillaume, Christophe Krzeminski
Workshop France-USA on Molecular-Scale Electronics, 2003, Paris, France. ⟨hal-00146645⟩
Scanning tunnelling spectroscopy of low dimensional semiconductor system
B. Grandidier
7th International Workshop on Beam Induced Assessment of Microstructures in Semiconductors, BIAMS 2003, 2003, Lille, France. ⟨hal-00146647⟩
Modélisation des antennes linéaires à l'aide de la méthode des éléments finis
Jamal Assaad, Anne-Christine Hladky, Sébastien Grondel, Emmanuel Moulin, B. Cugnet
Actes du Premier Congrès International sur la Modélisation Numérique Appliquée, CIMNA1-2003, 2003, Beyrouth, Liban. ⟨hal-00147107⟩
Using stationary wavelet transform in BCH image coding
A. Seddiki, A. Djebbari, Jean-Michel Rouvaen
Technical Acoustics, 2003, 1, pp.1-8. ⟨hal-00147092⟩
The use of permanently-mounted surface transducers to characterize Lamb wave propagation
Laurent Duquenne, Faysal El Youbi, Emmanuel Moulin, Sébastien Grondel, Jamal Assaad, Christophe Delebarre
WCU 2003, Sep 2003, Paris, France. pp.6001-6004. ⟨hal-00147113⟩
Low frequency drain noise comparison of AlGaN/GaN HEMTs grown on silicon, SiC and sapphire substrates
A. Curutchet, N. Malbert, N. Touboul, Christophe Gaquière, A. Minko, M. Uren
Microelectronics Reliability, 2003, 43, pp.1713-1718. ⟨hal-00146665⟩