Publicaciones
Affichage de 14281 à 14290 sur 16250
About the measurements of the d33 piezoelectric coefficient of the PZT film-Si/SiO2/Ti/Pt substrates using an optical cryostat
J. Nosek, L. Burianova, M. Sulc, Caroline Soyer, Eric Cattan, Denis Remiens
Ferroelectrics, 2003, 292, pp.103-109. ⟨hal-00146464⟩
Feedback of MEMS reliability study on the design stage : a step toward reliability aided design (RAD)
L. Buchaillot
14th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis, ESREF 2003, 2003, Arcachon, France. ⟨hal-00146457⟩
Reliable micromechanical relay for use in rough environment
F. Conseil, P. Derdeiran, M.F. Ravat, D. Collard, L. Buchaillot
2003, pp.243-247. ⟨hal-00146459⟩
Thermally actuated probe arrays for manipulation and characterization of individual bio-cell
Beomjoon Kim, Dominique Collard, Matthieu Lagouge, F. Conseil, Bernard Legrand, Lionel Buchaillot
TRANSDUCERS '03. 12th International Conference on Solid-State Sensors, Actuators and Microsystems, Jun 2003, Boston, MA, United States. pp.1255-1258, ⟨10.1109/SENSOR.2003.1217000⟩. ⟨hal-00146460⟩
Physics-based process simulation of ultrashallow junctions
N.E.B. Cowern, B. Colombeau, R. Duffy, V. Venezia, C. Dachs, R. Lindsay, Fuccio Cristiano, E. Lampin, Alain Claverie
Ultra-Shallow Junctions Worshop, 2003, Santa Cruz, CA, United States. ⟨hal-00146422⟩
The effect of quantum confinement on the optical properties of semiconductor nanocrystals
Christophe Delerue, Guy Allan
Materials Research Society Fall Meeting, 2003, Boston, MA, United States. ⟨hal-00146644⟩
HEMT métamorphique pour applications de puissance en bande V : influence de la couche de barrière
B. Bonte, M. Ardouin, M. Zaknoune, D. Theron, Y. Cordier, S. Bollaert, Jean-Claude de Jaeger
2003, pp.4A2-2. ⟨hal-00146696⟩
Electric force microscopy of individually charged semiconductor nanoparticles on conductive substrates : quantitative charge measurements and dipole-dipole interactions
Thierry Melin, H. Diesinger, D. Deresmes, D. Stiévenard
12th International Conference on Scanning Tunneling Microscopy, Spectroscopy and Related Techniques, STM'03, 2003, Eindhoven, Netherlands. ⟨hal-00146614⟩
Réalisation d'un banc de mesure d'intermodulation biton en bande Ka : application à l'analyse des causes technologiques de non-linéarité des HEMTs de puissance
Frédéric Bue-Erkmen
2003. ⟨hal-00146643⟩
Charge transport in self-assembled molecular rectifying diodes on silicon
Christophe Delerue, Guy Allan, Stéphane Lenfant, Dominique Vuillaume, Christophe Krzeminski
Workshop France-USA on Molecular-Scale Electronics, 2003, Paris, France. ⟨hal-00146645⟩