Publicaciones

• Communication dans un congrès

Photodetectors for microwave applications : a review and trends

Didier Decoster, Jean-Pierre Vilcot, Joseph Harari, V. Magnin

Photonics West, Integrated Optoelectronic Devices, OPTO 2003, Nanotechnologies in Photonics, Quantum Sensing : Evolution and Revolution from Past to Future, 2003, San Jose, CA, United States. ⟨hal-00146592⟩

• Communication dans un congrès

Caractérisation d'un filtre réjecteur à 350 GHz par échantillonnage Franz-Keldysh

L. Desplanque, Jean-Francois Lampin, F. Mollot

2003, pp.3C-1. ⟨hal-00146114⟩

• Communication dans un congrès

Characterization of MIS tunnel junctions by IETS

G. Salace, C. Petit, D. Vuillaume

203rd Meeting of the Electrochemical Society, 2003, Paris, France. ⟨hal-00146170⟩

• Communication dans un congrès

Modeling of failure mechanisms for optimized MEMS CAD : design, fabrication and characterization of in situ test benches

Olivier Millet, Vincent Agache, Bernard Legrand, Dominique Collard, Lionel Buchaillot

This work considers the reliability of surface microfabricated structures and particularly the dynamic response of structural layers during operations, in order to develop a statistical modelling of failure mechanisms for micro-actuator. In situ test benches have been designed and fabricated...

12th International Conference on Solid-State Sensors, Jun 2003, Boston, United States. pp.1578-1581, ⟨10.1109/SENSOR.2003.1217081⟩. ⟨hal-00146440⟩

• Communication dans un congrès

Polynomial method applied to acoustic waves in inhomogeneous cylinders

L. Elmaimouni, Jean-Etienne Lefebvre, Tadeusz Gryba, V. Zhang

2003, pp.1400-1403. ⟨hal-00145983⟩

• Communication dans un congrès

Impact of down scaling on high frequency noise performance of bulk and SOI MOSFETs

Gilles Dambrine, C. Raynaud, M. Vanmackelberg, Francois Danneville, G. Pailloncy, Sylvie Lepilliet, J.P. Raskin

SPIE Fluctuations and Noise Symposium, Noise in Devices and Circuits, 2003, Sante Fe, NM, United States. ⟨hal-00146001⟩

• Communication dans un congrès

Coupling of atom-by-atom calculations of extended defects with B kick-out equations : application to the simulation of boron TED

E. Lampin, Fuccio Cristiano, Y. Lamrani, Bernard Colombeau

European Materials Research Society Spring Meeting, 2003, Strasbourg, France. ⟨hal-00146423⟩

• Communication dans un congrès

Transmission electron microscopy of iridium silicide contacts for advanced MOSFET structures with Schottky source and drain

A. Laszcz, J. Katcki, J. Ratajczak, G. Larrieu, Emmanuel Dubois, X. Wallart

European Materials Research Society Fall Meeting, 2003, Warsaw, Poland. ⟨hal-00146424⟩

• Communication dans un congrès

Protéomique intégrée

S. Arscott, S. Le Gac, C. Druon, P. Tabourier, C. Rolando

Journées Nationales du Réseau Micro et Nano Technologies, 2003, Lille, France. ⟨hal-00146396⟩

• Communication dans un congrès

Transport électronique dans les systèmes moléculaires auto-assemblés, récents développements en électronique moléculaire

D. Vuillaume

10èmes Journées des Polymères Conducteurs, 2003, Dourdan, France. ⟨hal-00146384⟩