Publicaciones
Affichage de 14321 à 14330 sur 16379
Evidence of an impurity band at an n-GaN/sapphire interface
C. Mavroidis, J.J. Harris, R.B. Jackman, Z. Bougrioua, I. Moerman
Diamond and Related Materials, 2003, 12 (3-7), pp.1127-1132. ⟨10.1016/S0925-9635(02)00395-3⟩. ⟨hal-02906520⟩
Adsorption behavior of conjugated {C}3-oligomers on Si(100) and HOPG surfaces
Gauthier Mahieu, B. Grandidier, Didier Stiévenard, Christophe Krzeminski, Christophe Delerue, C. Martineau, Jean Roncali
Langmuir, 2003, 19 (8), pp.3350-3356. ⟨10.1021/la026907n⟩. ⟨hal-00688536⟩
Dimensionality-dependent self energy corrections and exchange-correlation potential in semiconductor nanostructures
Christophe Delerue, Guy Allan, Michel Lannoo
Physical Review Letters, 2003, 90, pp.076803/1-4. ⟨10.1103/PhysRevLett.90.076803⟩. ⟨hal-00146609⟩
Microelectromechanical variable-bandwidth if frequency filters with tunable electrostatical coupling spring
Dimitri Galayko, Andreas Kaiser, Lionel Buchaillot, Dominique Collard, Chantal Combi
Micro Electro Mechanical Systems, 2003. MEMS-03 Kyoto. IEEE The Sixteenth Annual International Conference on, Jan 2003, Kyoto, Japan. ⟨10.1109/MEMSYS.2003.1189709⟩. ⟨hal-01522205⟩
Detection of chemical damage in concrete cover using ultrasound
F. Buyle-Bodin, S. Ould Naffa, M. Goueygou, Bogdan Piwakowski
Proceedings of the 2003 International Conference on Performance of Construction Materials in the New Millennium, ICPCM 2003, 2003, Cairo, Egypt. ⟨hal-00250183⟩
Realization of waveguiding epitaxial GaN layers on Si by low-pressure metalorganic vapor phase epitaxy
H.P.D. Schenk, E. Feltin, M. Laugt, O. Tottereau, P. Vennegues, El Hadj Dogheche
Applied Physics Letters, 2003, 83, pp.5139-5141. ⟨hal-00162728⟩
Dispositifs optoélectroniques basés sur des matériaux organiques : conception, fabrication et caractérisation
M. Berliocchi
2003. ⟨hal-00162731⟩
Etude et réalisation d'un système radar coopératif destiné aux systèmes de transports guidés
B. Fremont
2003. ⟨hal-00162744⟩
Les Interconnexions cuivre sont-elles un verrou technologique majeir pour les circuits ULSI du futur utilisant la technologie ultime ? Analyse électromagnétique et performances
K. El Bouazzati, Jean-François Legier, Erick Paleczny, Christophe Seguinot, Denis Deschacht
Telecom et JFMMA, 2003, Marrakech, Maroc. ⟨lirmm-00269827⟩
Characterization of surface cracks in metals by microwave techniques
D. Glay, T. Lasri
GREEN R.E. JR., DJORDJEVIC B.B., HENTSCHEL M.P. Nondestructive characterization of materials XI, Springer Verlag, pp.345-352, 2003. ⟨hal-00132310⟩