Publicaciones

• Communication dans un congrès

Self-assembled molecular rectifying diodes on silicon : synthesis, experimental and theoretical charge transport studies

Stéphane Lenfant, Dominique Vuillaume, Christophe Krzeminski, Guy Allan, Christophe Delerue, F. Tran Van, C. Chevrot

7th European Conference on Molecular Electronics, ECME 2003, Sep 2003, Avignon, France. ⟨hal-00146179⟩

• Article dans une revue

Influence on the step covering on fatigue phenomenon for polycrystalline silicon MEMS

O. Millet, Bernard Legrand, D. Collard, L. Buchaillot

Japanese Journal of Applied Physics, 2003, 41, pp.L1339-L1341. ⟨hal-00146435⟩

• Communication dans un congrès

New Schottky source/drain architectures

Emmanuel Dubois

Workshop Micro et Nanoélectronique, 2003, Crolles, France. ⟨hal-00146417⟩

• Article dans une revue

Feedback of MEMS reliability study on the design stage : a step toward reliability aided design (RAD)

L. Buchaillot

Microelectronics Reliability, 2003, 43, pp.1919-1928. ⟨hal-00146437⟩

• Communication dans un congrès

2½ D microfabricated nib-like sources for nanoelectrospray applications

S. Le Gac, S. Arscott, C. Rolando

2003, pp.1211-1214. ⟨hal-00146442⟩

• Article dans une revue

Accurate modelling of large angle tilt (LATID) and pure vertical implantations : application to the simulation of n- and p-LDMOS backgates

Evelyne Lampin, Emmanuel Dubois, H. Xu, S. Bardy, F. Murray

The lateral and vertical extensions of the backgate of complementary laterally diffused metal oxide semiconductor (LDMOS) are simulated. The importance of channeling for a large-angle tilt implantation and a purely vertical (0°) implantation are studied with the atomistic simulator Crystal-TRIM....

IEEE Transactions on Electron Devices, 2003, 50 (5), pp.1401-1404. ⟨10.1109/TED.2003.813464⟩. ⟨hal-00146392⟩

• Article dans une revue

Strain determination in silicon microstructures by combined TEM/CBED, process simulation and micro-Raman spectroscopy

V. Senez, A. Armigliato, I. de Wolf, G. Carnevale, R. Balboni, S. Frabboni, A. Benedetti

Test structures consisting of shallow trench isolation (STI) structures are fabricated using advanced silicon (Si) technology. Different process parameters and geometrical features are implemented to investigate the residual mechanical stress in the structures. A technology computer aided design...

Journal of Applied Physics, 2003, 94 (9), pp.5574-5583. ⟨10.1063/1.1611287⟩. ⟨hal-00146408⟩

• Article dans une revue

T-ray generation by photomixing : performance and prospects, Génération aux fréquences térahertz par photomélange : performances et perspectives

Gaël Mouret, Sophie Matton, Pascal Masselin, Robin Bocquet, Emilien Peytavit, S. Arscott, Jean-Francois Lampin, F. Mollot, D. Lippens

La Revue de l'électricité et de l'électronique, 2003, 1, pp.32-36. ⟨hal-00162723⟩

• Communication dans un congrès

A low complexity suboptimal MIMO receiver : the combined ZF-MLD algorithm

V. Pammer, Yves Delignon, Wadih Sawaya, David Boulinguez

Recently, wireless technologies have known an increasing success, thus becoming an interesting field for study. One of the topics of research are multiple antenna arrays. Signal recovery in that case is not obvious. Different methods with different performances have been suggested. From a...

4th IEEE Proceedings on Personal, Indoor and Mobile Radio Communications, PIMRC 2003., Sep 2003, Beijing, China. pp.2271-2275, ⟨10.1109/PIMRC.2003.1259122⟩. ⟨hal-00162727⟩

• Chapitre d'ouvrage

Metamorphic InAIAs/InGaAs HEMTs : material properties and device performance

Y. Cordier, S. Bollaert, M. Zaknoune, J.M. Chauveau, A. Cappy

CAI W.Z. III-V semiconductor heterostructures : physics and devices, Research Signpost, Kerala, India, pp.111-138, 2003. ⟨hal-00132383⟩