Publicaciones

Affichage de 14461 à 14470 sur 16255


  • Communication dans un congrès

Caractérisation d'objets enfouis - Estimation du coefficient de réflexion

Latifa Achrait-Furlan, T. Lasri, Ahmed Mamouni

Actes de TELECOM 03 et 3èmes Journées Franco-Maghrébines des Microondes et leurs Applications, JFMMA 2003, 2003, Marrakech, Maroc. pp.1D-20. ⟨hal-00146066⟩

  • Communication dans un congrès

Transmission electron microscopy analysis of silicides used in ALSB-SOI MOSFET structures

J. Katcki, J. Ratajczak, A. Laszcz, F. Phillipp, Emmanuel Dubois, Guilhem Larrieu, Julien Penaud, Xavier Baie

In Accumulated Low Schottky Barrier metal oxide semiconductor field effect transistors (MOSFET) on SOl structures, very thin silicide layers are used for ohmic contacts. Silicide contacts form due to metallurgical reaction of metal with semiconductor. In order to get a broad vision of the most...

Conference on Microscopy of Semiconducting Materials, Mar 2003, Cambridge, United Kingdom. pp.479-482, ⟨10.1201/9781351074636-110⟩. ⟨hal-00250182⟩

  • Communication dans un congrès

Nonlinear acoustics of phase conjugate waves in heterogeneous media (NGA approach)

Vladimir Preobrazhensky, Philippe Pernod

2003, pp.875-878. ⟨hal-00146134⟩

  • Communication dans un congrès

Visualization of phase conjugate ultrasound waves passed through inhomogeneous layer

K. Yamamoto, Philippe Pernod, Vladimir Preobrazhensky

Ultrasonics International, 2003, Granada, Spain. ⟨hal-00146159⟩

  • Communication dans un congrès

On lateral organization of quantum dots on a nanopatterned substrate

C. Priester

Materials Research Society Fall Meeting, Symposium T : Self-Organized Processes in Semiconductor Heteroepitaxy, 2003, Boston, MA, United States. ⟨hal-00146119⟩

  • Article dans une revue

Inelastic electron tunneling spectroscopy in n-MOS junctions with ultra-thin oxides

C. Petit, G. Salace, D. Vuillaume

Solid-State Electronics, 2003, 47, pp.1663-1668. ⟨hal-00146155⟩

  • Communication dans un congrès

Self-assembled materials

D. Vuillaume

International Summer School on Advanced Microelectronics, MIGAS 2003, 2003, Autrans, France. ⟨hal-00146172⟩

  • Communication dans un congrès

Nondestructive defects detection inside dielectric materials by microwave techniques

M. Maazi, D. Glay, T. Lasri

2003, pp.Session 3A. ⟨hal-00146044⟩