Publicaciones

Affichage de 14471 à 14480 sur 16181


  • Communication dans un congrès

Nondestructive defects detection inside dielectric materials by microwave techniques

M. Maazi, D. Glay, T. Lasri

2003, pp.Session 3A. ⟨hal-00146044⟩

  • Article dans une revue

Optical properties of hexagonal boron nitride thin layers

A. Soltani, H. Bakhtiar, P. Thévenin, A. Bath

Jurnal Fizik UTM, 2003, 9, pp.17-25. ⟨hal-00146670⟩

  • Communication dans un congrès

High frequency noise sources extraction in nanometrique MOSFETs

Francois Danneville, G. Pailloncy, Gilles Dambrine

NATO Advanced Research Workshop, Advanced Experimental Methods for Noise Research in Nanoscale Electronic Devices, 2003, Brno, Czech Republic. ⟨hal-00146038⟩

  • Communication dans un congrès

Integrated InP optical switches based on carrier-induced index variation

Hongwu Li, Karine Blary, Samuel Dupont, Jean-Pierre Vilcot, Joseph Harari, Jean Chazelas, Didier Decoster

We present theoretical study, technological realization and characterization of fabricated devices: TIR switches, electro-optical directional coupler switches and DOS switches because of their good linearity, low noise figure and short switching time which make them particularly suitable for...

Microwave and Optical Technology, Aug 2003, Ostrava, Czech Republic. ⟨10.1117/12.558773⟩. ⟨hal-00146591⟩

  • Communication dans un congrès

Accordabilité d'un circuit microonde par adjonction d'un substrat cristal liquide

Nicolas Tentillier, Bertrand Splingart, Erick Paleczny, Jean-François Legier, Christian Legrand

Treizièmes Journées Nationales Micro-ondes (JNM 2003), May 2003, Lille, France. pp.3D-4. ⟨hal-00146562⟩

  • Communication dans un congrès

Comparative measurements of the optical spectrum dependence on distance between laterally coupled diode lasers

H. Lamela, R. Santos, G. Carpintero, Jean-Pierre Vilcot, A. Barsella, J. Figueiredo, M. Pessa

2003, pp.86-91. ⟨hal-00146495⟩

  • Communication dans un congrès

Relation between thermal evolution of interstitial defects and transient enhanced diffusion in silicon

Alain Claverie, Fuccio Cristiano, B. Colombeau, Xavier Hebras, P. Calvo, Nikolay Cherkashin, Y. Lamrani, E. Scheid, B. de Mauduit

2003, pp.73. ⟨hal-00146421⟩