Publicaciones
Affichage de 14641 à 14650 sur 16566
Influence on the step covering on fatigue phenomenon for polycrystalline silicon MEMS
O. Millet, Bernard Legrand, D. Collard, L. Buchaillot
Japanese Journal of Applied Physics, 2003, 41, pp.L1339-L1341. ⟨hal-00146435⟩
New Schottky source/drain architectures
Emmanuel Dubois
Workshop Micro et Nanoélectronique, 2003, Crolles, France. ⟨hal-00146417⟩
Feedback of MEMS reliability study on the design stage : a step toward reliability aided design (RAD)
L. Buchaillot
Microelectronics Reliability, 2003, 43, pp.1919-1928. ⟨hal-00146437⟩
2½ D microfabricated nib-like sources for nanoelectrospray applications
S. Le Gac, S. Arscott, C. Rolando
2003, pp.1211-1214. ⟨hal-00146442⟩
Accurate modelling of large angle tilt (LATID) and pure vertical implantations : application to the simulation of n- and p-LDMOS backgates
Evelyne Lampin, Emmanuel Dubois, H. Xu, S. Bardy, F. Murray
IEEE Transactions on Electron Devices, 2003, 50 (5), pp.1401-1404. ⟨10.1109/TED.2003.813464⟩. ⟨hal-00146392⟩
Strain determination in silicon microstructures by combined TEM/CBED, process simulation and micro-Raman spectroscopy
V. Senez, A. Armigliato, I. de Wolf, G. Carnevale, R. Balboni, S. Frabboni, A. Benedetti
Journal of Applied Physics, 2003, 94 (9), pp.5574-5583. ⟨10.1063/1.1611287⟩. ⟨hal-00146408⟩
Lead Zirconate Titanate (PZT) Films Deposited by a Hydrothermal Method
Sébastien Euphrasie, Sylvie Daviero-Minaud, Philippe Pernod
Solid State Sciences, 2003, 5 (11-12), pp.1499-1504. ⟨10.1016/j.solidstatesciences.2003.10.002⟩. ⟨hal-00258427⟩
Acoustique picoseconde et structure électronique
Arnaud Devos
2èmes Journées Ultrasons-Laser, 2003, Paris, France. ⟨hal-00145962⟩
Propriétés vibratoires d'une chaîne finie de sphères couplées
Anne-Christine Hladky, Arnaud Devos, M. de Billy
Actes des Journées du GDR 2501 : Etude de la propagation ultrasonore en milieux inhomogènes en vue du contrôle non destructif, 2003, Aussois, France. ⟨hal-00145975⟩
Arabic isolated word recognition using general regression neural network
A. Amrouche, Jean-Michel Rouvaen
2003, pp.689-692. ⟨hal-00154885⟩