Publicaciones
Affichage de 15241 à 15250 sur 16105
A new ultra-violet microradiometer
Katir Ziouche, Mohamed Boutchich, D. Loridant-Bernard, Pascale Godts, Didier Leclercq
Sensors 2001, 2001, Nuremberg, Germany. pp.221-226. ⟨hal-00152186⟩
Modeling and characterization of GaAs/Ga1-xA1xAs MQW acousto-electro-optic modulators
Joseph Gazalet, F. Sainte-Rose, Jean-Etienne Lefebvre, Tadeusz Gryba
2001, pp.27-29. ⟨hal-00151741⟩
Modulateur acousto-optique à puits quantiques. Modélisation et mise en œuvre
Joseph Gazalet
2001. ⟨hal-00151733⟩
Conception et réalisation d'une instrumentation appliquée aux mesures de flux thermiques en milieu industriel
Franck Brachelet
2001. ⟨hal-00152190⟩
Low frequency noise conversion in FETs under nonlinear operation
Francois Danneville, B. Tamen, A. Cappy, J.B. Juraver, Olivier Llopis, Jacques Graffeuil
2001, pp.247-250. ⟨hal-00151767⟩
Elastic properties of silicate glass and silicon nitride films for submicron electronic devices
G. Carlotti, P. Colpani, D. Piccolo, S. Santucci, V. Senez, G. Socino, L. Verdini
Proceedings of the 17th International Congress on Acoustics, ICA 2001, 2001, Roma, Italy. ⟨hal-00152222⟩
Contribution à l’optimisation du contrôle santé intégré par ondes de Lamb : application à la surveillance de structures aéronautiques, Optimization of Lamb wave based health monitoring systems for aeronautical structure inspection
Sébastien Grondel
Electronique. Université de Valenciennes et du Hainaut-Cambrésis, 2000. Français. ⟨NNT : 2000VALE0030⟩. ⟨hal-00159072⟩
Theoretical simulation of free carrier mobility collapse in GaN in terms of dislocation walls
J-L Farvacque, Z. Bougrioua, I Moerman
Journal of Physics: Condensed Matter, 2000, 12 (49), pp.10213-10221. ⟨10.1088/0953-8984/12/49/321⟩. ⟨hal-02906495⟩
Quantifying the smoothing of GaN epilayer growth by in situ laser interferometry
A Stafford, S.J.C Irvine, Z. Bougrioua, K. Jacobs, I Moerman, E.J Thrush, L Considine
Journal of Crystal Growth, 2000, 221 (1-4), pp.142-148. ⟨10.1016/S0022-0248(00)00674-6⟩. ⟨hal-02906485⟩
Streaming and removal forces due to second-order sound field during megasonic cleaning of silicon wafers
Jerome O. Vasseur, P. Deymier, J. Vasseur, A. Khelif, Bahram Djafari-Rouhani, L. Dobrzynski, S. Raghavan
Journal of Applied Physics, 2000, 88 (11), pp.6821-6835. ⟨10.1063/1.1323521⟩. ⟨hal-03301993⟩