Publicaciones
Affichage de 15271 à 15280 sur 16182
Modulateur acousto-optique à puits quantiques. Etude théorique et expérimentale
F. Sainte-Rose
2001. ⟨hal-00151719⟩
Réalisation de modulateurs acousto-électro-optiques à puits quantiques GaAs/Ga1-xAIxAs
F. Sainte-Rose, Tadeusz Gryba, Joseph Gazalet, Jean-Etienne Lefebvre
Journées Nationales du Réseau Doctoral de Microélectronique, 2001, Strasbourg, France. ⟨hal-00151742⟩
Investigations of stress sensitivity of 0.12 CMOS technology using process modeling
V. Senez, T. Hoffmann, E. Robilliart, G. Bouche, H. Jaouen, M. Lunenborg, G. Carnevale
2001, pp.38.1.1-4. ⟨hal-00152241⟩
0.06µm gate length metamorphic InAlAS/InGaAs HEMTs on GaAs with ft and fmax
S. Bollaert, Y. Cordier, M. Zaknoune, T. Parenty, H. Happy, Sylvie Lepilliet, A. Cappy
2001, pp.192-195. ⟨hal-00151759⟩
Silicon on chip microfluidic system for peptide analysis by Esi-Mass spectrometry
X. Melique, S. Le Gac, C. Druon, C. Rolando, P. Tabourier
2nd International Meeting on Micro and Nanotechnologies, MINATEC 2001, 2001, Grenoble, France. ⟨hal-00152206⟩
Low frequency noise conversion in FETs under nonlinear operation
Francois Danneville, B. Tamen, A. Cappy, J.B. Juraver, Olivier Llopis, Jacques Graffeuil
2001, pp.247-250. ⟨hal-00151767⟩
Elastic properties of silicate glass and silicon nitride films for submicron electronic devices
G. Carlotti, P. Colpani, D. Piccolo, S. Santucci, V. Senez, G. Socino, L. Verdini
Proceedings of the 17th International Congress on Acoustics, ICA 2001, 2001, Roma, Italy. ⟨hal-00152222⟩
Nonlinear noise modeling of a PHEMT device through residual phase noise and low frequency noise measurements
Olivier Llopis, J.B. Juraver, B. Tamen, Francois Danneville, M. Chaubet, A. Cappy, Jacques Graffeuil
2001, pp.831-834. ⟨hal-00151779⟩
Détermination de caractéristiques I(V) en régime dynamique grand signal de transistors HEMTs AlGaN/GaN
N. Vellas, Christophe Gaquière, Y. Guhel, B. Boudart, E. Delos, Jean-Claude de Jaeger
Actes des 12èmes Journées Nationales Microondes, JNM 2001, 2001, Poitiers, France. ⟨hal-00152654⟩
Properties of electronic traps at silicon/1-octadecene interfaces
S. Kar, C. Miramond, D. Vuillaume
Applied Physics Letters, 2001, 78, pp.1288-1290. ⟨hal-00152160⟩