Publicaciones
Affichage de 15351 à 15360 sur 16261
Organic thin film transistors with ferroelectric gate oxide
S. Queste, G. Velu, K. Lmimouni, D. Vuillaume, A. Chapoton, C. Legrand, Denis Remiens
7th European Conference on Molecular Electronics, 2001, Kerkrade, Netherlands. ⟨hal-00152183⟩
Retro-focusing of phase conjugate acoustic beams in nonlinear inhomogeneous media
Vladimir Preobrazhensky, Philippe Pernod
Proceedings of the 17th International Congress on Acoustics, ICA 2001, 2001, Roma, Italy. ⟨hal-00152122⟩
Tight binding for complex semiconductor systems
Christophe Delerue, Michel Lannoo, Guy Allan
physica status solidi (b), 2001, 227, 1, pp.115-149. ⟨10.1002/1521-3951(200109)227:13.0.CO;2-2⟩. ⟨hal-00018572⟩
Effect of alkyl substituents on the adsorption of thienylenevinylene oligomers on the Si(100) surface
B. Grandidier, J.P. Nys, D. Stievenard, Christophe Krzeminski, C. Delerue, P. Frere, P. Blanchard, J. Roncali
Surface Science : A Journal Devoted to the Physics and Chemistry of Interfaces, 2001, 473, 1-2, pp.1-7. ⟨10.1016/S0039-6028(00)00946-8⟩. ⟨hal-00018576⟩
Micro-robotic systems for MIS and micromanipulation
S. Regnier, Y. Rollot, J.C. Guinot, S. Haliyo, G. Dumont, L. Buchaillot, D. Salle, M. Dahan
IARP International Workshop on Advanced Robotics Research and Applications, 2001, Shangai, China. ⟨hal-00152467⟩
Etudes technologiques, expérimentales et par simulation pour la commutation optique sur InP
Y. Hernandez
2001. ⟨hal-00152491⟩
An analytical model for molecular-scale charge transport
I.R. Peterson, D. Vuillaume, R. Metzger
The Journal of physical chemistry, 2001, A105, pp.4702-4707. ⟨hal-00152154⟩
Numerical modeling, experimental investigations and stress control for flat glass tempering
E. Romero, Dominique Lochegnies, Marc Duquennoy
2001, pp.242-247. ⟨hal-00152939⟩
Corrosion thickness gauging in plates using lamb wave group velocity measurements
Frédéric Jenot, Mohammadi Ouaftouh, Marc Duquennoy, Mohamed Ourak
Measurement Science and Technology, 2001, 12, pp.1287-1293. ⟨hal-00152926⟩
Low Schottky barrier source/drain for advanced MOS architecture : device, design and material consideration
Emmanuel Dubois, G. Larrieu
2001, pp.53-56. ⟨hal-00152233⟩