Publicaciones
Affichage de 15421 à 15430 sur 16182
Caractérisation des tumeurs du sein par imagerie radiométrique microonde
Bertrand Bocquet, Y. Leroy, Ahmed Mamouni, N. Rocourt, Patrick Devos, Y. Robert
6èmes Journées Caractérisation Microonde et Matériaux, JCMM 2000, 2000, Paris, France. ⟨hal-00158168⟩
Design and testing of Langevin type transducers with PMN-PT-La (90-10-1%) ceramics
J. Coutte, J.C. Debus, Bertrand Dubus, C. Granger
US Navy Workshop on Acoustic Transduction Materials and Devices, 2000, State College, United States. ⟨hal-00157835⟩
Numerical modelling of shape memory alloy nonlinear behavior laws : application to an adaptative structure
Anne-Christine Hladky, S. Rafanomezantsoa, L. Buchaillot
ONR Workshop on Acoustic Transduction Materials and Devices, 2000, University Park, United States. ⟨hal-00157842⟩
Dispositifs radiométriques pour usage industriel : réalisation et modélisation d'une nouvelle génération d'antenne capteur
C. Vanoverschelde
2000. ⟨hal-00158134⟩
Weighting functions for near field microwave radiometry and applications
Ahmed Mamouni, T. Lasri, Bertrand Bocquet, Y. Leroy
Proceedings of the 2000 Progress in Electromagnetics Research Symposium, PIERS 2000, Jul 2000, Cambridge, MA, United States. ⟨hal-00158174⟩
Numerical modelling, experimental investigations, stress control for flat glass tempering
Dominique Lochegnies
Challenges and Breakthrough Technologies, 2000, Amsterdam, Netherlands. ⟨hal-00159082⟩
On the design of multimode ultrasonic transducers for acoustooptic correlation applications
Jean-Michel Rouvaen, Atika Rivenq, P. Logette, Philippe Goutin, F. Haine
Journal of Physics D: Applied Physics, 2000, 33, pp.3041-3052. ⟨hal-00159047⟩
Silicon nitride passivation on GaN MESFET's
Christophe Gaquière, B. Boudart, R. Amokrane, Y. Guhel, Y. Crosnier, Jean-Claude de Jaeger, F. Omnes
2000, pp.VIII-11, VIII-12. ⟨hal-00159001⟩
3-Dimensional process simulation of thermal annealing of low dose implanted dopants in silicon
V. Senez, J. Herbaux, T. Hoffmann, E. Lampin
IEICE Transactions on Electronics, 2000, E83-C, pp.1267-1274. ⟨hal-00158495⟩