Publicaciones
Affichage de 15471 à 15480 sur 16109
HEMT structures on GaAs or InP substrates for millimeter wave power amplification
Didier Theron, Yvon Cordier, X. Wallart, S. Bollaert, Mohammed Zaknoune, Mustafa Boudrissa, Bertrand Bonte, Christophe Gaquière, Francis Mollot, A. Cappy, R. Fauquembergue, Jean-Claude de Jaeger
24th Workshop on Compound Semiconductor Devices and Integrated Circuits held in Europe, WOCSDICE'2000, May 2000, Aegean Sea, Greece. ⟨hal-00159030⟩
On 2D/3D numerical oxidation modeling : calibration and investigation of silicon crystal orientation effect on stresses in shallow trench isolations
T. Hoffmann, K.F. Dombrowski, V. Senez
2000, pp.59-62. ⟨hal-00158513⟩
Charge control and electron transport properties in InAlAs/InGaAs metamorphic HEMT's : effect of indium content
Y. Cordier, M. Zaknoune, S. Bollaert, A. Cappy
2000, pp.102-105. ⟨hal-00159005⟩
AlGaInP barrier layer grown by gas source molecular beam epitaxy for V-band AlGaInP/InGaAs/GaAs power pseudomorphic HEMT
M. Zaknoune, O. Schuler, X. Wallart, S. Piotrowicz, F. Mollot, D. Theron, Y. Crosnier
2000, pp.353-356. ⟨hal-00159004⟩
A silicon shadow mask for deposition on isolated areas
A. Tixier, Y. Mita, J.P. Gouy, H. Fujita
Journal of Micromechanics and Microengineering, 2000, 10, pp.157-162. ⟨hal-00158497⟩
Very low-voltage fully differential amplifier for switched capacitor applications
M. Dessouky, A. Kaiser
2000, pp.441-444. ⟨hal-00158508⟩
Optique adaptative : réalisation et actionnement d'une membrane continue par un réseau de micro-actionneurs 3D auto-assemblés
E. Quevy, L. Buchaillot, D. Collard
Actes des 20èmes Journées Nationales d'Optique Guidée, 2000, Toulouse, France. ⟨hal-00158521⟩
Organic semiconductors : application to light emitting diodes and thin film transistors
K. Lmimouni
Université de Rome Tor Vergata, 2000, Roma, Italy. ⟨hal-00158483⟩
Determination of the electrical properties of thermally grown ultrathin nitride films
N. Pic, A. Glachant, S. Nitsche, J.Y. Hoarau, D. Goguenheim, D. Vuillaume, A. Sibai, C. Chaneliere
Microelectronics Reliability, 2000, 40, pp.589-592. ⟨hal-00158478⟩
Microfluidique pour l'introduction des échantillons en ESI/MS
C. Druon, P. Tabourier
2000, pp.11-14. ⟨hal-00158487⟩