Publicaciones
Affichage de 15781 à 15790 sur 16261
Etude expérimentale de l'inversion thermique en radiométrie micro-onde par corrélation : applications médicales
S. Bri, L. Bellarbi, M. Elkadiri, L. Zenkour, M. Habibi, A. Mamouni
6èmes Journées Caractérisation Microonde et Matériaux, JCMM 2000, 2000, Paris, France. ⟨hal-00158164⟩
New 434 MHz interstitial hyperthermia system monitored by radiometry : theoretical studies and experimental results
J.C. Camart, D. Despretz, B. Prevost, J.P. Sozanski, M. Chive, J. Pribetich
International Journal of Hyperthermia, 2000, 16, pp.95-111. ⟨hal-00158149⟩
Towards terahertz circuits via InP micromachining techniques
S. Arscott, T. David, X. Melique, P. Mounaix, D. Lippens
2000, pp.561-564. ⟨hal-00158203⟩
High Q InP-based varactor diodes
T. David, P. Mounaix, X. Melique, F. Mollot, O. Vanbésien, M. Chaubet, D. Lippens
Proceedings of the 11th International Symposium on Space Terahertz Technology, 2000, Ann Arbor, MI, United States. ⟨hal-00158223⟩
Evidence of polariton stimulation in semiconductor microcavities
F. Boeuf, R. Andre, R. Romestain, S.L. Dang, Emmanuel Peronne, Jean-Francois Lampin, D. Hulin, Antigoni Alexandrou
Physical Review B: Condensed Matter and Materials Physics (1998-2015), 2000, 62 (4), pp.R2279(R). ⟨hal-00158233⟩
Conical radiating waves in immersed wedges
Anne-Christine Hladky, P. Langlet, M. de Billy
Journal of the Acoustical Society of America, 2000, 108, pp.3079-3083. ⟨hal-00157821⟩
Finite element modeling of damping using piezoelectric materials
Anne-Christine Hladky, C. Granger
2000, pp.64-65. ⟨hal-00157823⟩
GaN MESFETs for power and high temperature applications
B. Boudart, S. Trassaert, Christophe Gaquière, D. Theron, Y. Crosnier, François Huet, M.A. Poisson, I. Daumiller, E. Kohn
NearEst Miniworkshop on Advances in the Wide Bandgap Electronics and Opto-Electronics, 2000, Padova, Italy. ⟨hal-00159032⟩
Dry etching for gate recessing on AlGaN/GaN HEMTs
Y. Guhel, B. Boudart, M.A. Poisson, Jean-Claude de Jaeger
10th European Workshop on Heterostructure Technology, HeTech 2000, 2000, Ulm, Germany. ⟨hal-00159034⟩
Microscopic characterization of defects using scanning tunneling microscopy
D. Stievenard
Materials Science and Engineering: B, 2000, B71, pp.120-127. ⟨hal-00158667⟩