Publicaciones

Affichage de 5831 à 5840 sur 16064


  • Communication dans un congrès

Improved Cluster-tree Topology Adapted for Indoor environement in Zigbee Sensor Network

Mourad Ouadou, Ouadoudi Zytoune, Driss Aboutajdine, Yassin El Hillali, Atika Rivenq

Wireless Sensor Network (WSN) is a collection of small sensor nodes with aptitude to sense, compute and transmit data that are deployed to observe a physical environment. The sensor node has limited capabilities, especially for energy reserve and memory storage, that is why topology and routing...

11th International Conference on Future Networks and Communications, FNC 2016 / 13th International Conference on Mobile Systems and Pervasive Computing, MobiSPC 2016, Aug 2016, Montreal, Canada. pp.272-279, ⟨10.1016/j.procs.2016.08.041⟩. ⟨hal-03528687⟩

  • Communication dans un congrès

Metal/insulator/semiconductor contacts for ultimately scaled CMOS nodes: projected benefits and remaining challenges

Julien Borrel, Louis Hutin, Helen Grampeix, Emmanuel Nolot, Magali Tessaire, Guillaume Rodriguez, Yves Morand, Fabrice Nemouchi, Magali Gregoire, Emmanuel Dubois, Maud Vinet

In this paper, some key fundamental aspects of Metal / Insulator / Semiconductor contacts as well as practical issues occurring with their implementation are reviewed in order to fully comprehend the opportunities and limitations of this approach.

IWJT 2016 - 16th International Workshop on Junction Technology, May 2016, Shanghai, China. pp.14-19. ⟨hal-03325000⟩

  • Communication dans un congrès

Development of a reference wafer for on-wafer testing of extreme impedance devices

H. Votsi, I. Roch-Jeune, Kamel Haddadi, C. Li, Gilles Dambrine, P. H. Aaen, N. Ridler

This paper describes the design, fabrication, and testing of an on-wafer substrate that has been developed specifically for measuring extreme impedance devices using an on-wafer probe station. Such devices include carbon nano-tubes (CNTs) and structures based on graphene which possess impedances in...

88th ARFTG Microwave Measurement Symposium, ARFTG 2016, Dec 2016, Austin, United States. 4 p., ⟨10.1109/ARFTG.2016.7839719⟩. ⟨hal-03224658⟩

  • Communication dans un congrès

New Optical Approach of SAW Delay Line Characterization

Lyes Djoumi, Nikolay Smagin, Meddy Vanotti, Dame Fall, Etienne Herth, Marc Duquennoy, Mohammadi Ouaftouh, Virginie Blondeau-Patissier, Frédéric Jenot

Surface acoustic wave devices are usually characterized solely through their electrical parameters. Mechanical displacements can also be numerically computed using finite element software. In this paper, we show that this characterization can be supplemented using an interferometer system capable...

30th Eurosensors Conference, EUROSENSORS XXX, Sep 2016, Budapest, Hungary. pp.838-843. ⟨hal-03586205⟩

  • Article dans une revue

Wettability of PEDOT:PSS films

Caroline Duc, Alexis Vlandas, G. Malliaras, V. Senez

Soft Matter, 2016, 12 (23), pp.5146-5153. ⟨10.1039/C6SM00599C⟩. ⟨hal-02566997⟩

  • Communication dans un congrès

In-situ solder surface tension measurements using mechanical resonances

Assane Ndieguene, Jean-Francois Morissette, Nathalie Normand, Julien Sylvestre

2016 17th International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems (EuroSimE), Apr 2016, Montpellier, France. ⟨10.1109/EuroSimE.2016.7463343⟩. ⟨hal-01927506⟩

  • Article dans une revue

Wetting characterization of high aspect ratio nanostructures by gigahertz acoustic reflectometry

Christophe Virgilio, Julien Carlier, Pierre Campistron, Malika Toubal, Philippe Garnier, L. Broussous, V. Thomy, Bertrand Nongaillard

Wetting efficiency of microstructures or nanostructures patterned on Si wafers is a real challenge in integrated circuits manufacturing. In fact, bad or non-uniform wetting during wet processes limits chemical reactions and can lead to non-complete etching or cleaning inside the patterns and device...

International Journal of Mechanical and Mechatronics Engineering, 2016, 10 (3), pp.413-418. ⟨hal-03560404⟩

  • Article dans une revue

In-flow detection of ultra-small magnetic particles by an integrated giant magnetic impedance sensor

Kamel Fodil, Matthieu Denoual, Christophe Dolabdjian, A. Treizebre, Vincent Senez

Applied Physics Letters, 2016, ⟨10.1063/1.4948286⟩. ⟨hal-01417815⟩